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Poster contributions

-   EPMA and microscopy investigation of clinker minerals for quality control and expertise.
               F. Amin, L. Bonafous, B. Bollotte, P. Le Coustumer, M. Fialin and J.H. Thomassin

-   Microanalysis and cultural heritage: microdestructive analyses of archaeological finds.
               R. Arletti, S. Bigi and S. Giovannini

-   Quantitative thin film X-ray microanalysis by STEM/HAADF: statistical analysis for accuracy determination.
               A. Armigliato, R. Balboni and R. Rosa

-   The L spectra of the elements Z < 23.
               A. Assmann, J. Dellith and M. Wendt

-   Electron excited L X-ray spectra of the elements 24 = Z = 33.
               A. Assmann, J. Dellith and M. Wendt

-   Crystal chemistry of B-rich vesuvianites: a combined EPMA, SIMS, XRD, and FTIR study.
               F. Bellatreccia, L.P. Ottolini, G. Della Ventura and F. Cámara

-   Laboratory microbeam analysis applied to cultural heritage studies.
               D. Benedetti, I. Alessandri, P. Bergese, E. Bontempi, P. Colombi, D. Garipoli, R. Pedrazzani and L.E. Depero

-   Microprobe analysis of Co, Mn and Ni in ZnO grains of varistor ceramics.
               S. Bernik, Z. Samardzija and R.B. Marinenko

-   New development in environmental SEM for imaging nano-objects in water.
               A. Bogner, G. Thollet, P.-H. Jouneau, C. Gauthier and G. Fuchs

-   µ-PIXE analysis and CL spectroscopy on monazite from Dora Maira Massif (Italy): a new petrologic and dating approach.
               A. Borghi, R. Cossio, L. Giuntini, L. Lombardo, M. Massi, F. Olmi, P. Rossetti and G. Vaggelli

-   Y geothermometer applied to garnets of different metamorphic facies from Calabrian-Peloritan Arc, Southern Italy: constraints by EPMA and µ-PIXE techniques.
               A. Borghi, R. Compagnoni, R. Cossio, L. Giuntini, M. Massi, F. Olmi, A.P. Santo and G. Vaggelli

-   Surface analytical studies on corrosion reactions of metal halide salts.
               A. Böröczki, G. Dobos and V.K. Josepovits

-   Macroscopic examination and microscopic analysis of the degraded Phébus FPT2 bundle at ITU.
            P.D.W. Bottomley, S. Brémier, D. Papaioannou, C.T. Walker, J.-P. Glatz, S. Schlutig and M. Barrachin

-   Uniformity of phase-change layers measured with EPMA.
            P.H. Breimer and A.E.T. Kuiper

-   Installation of a shielded secondary ion mass spectrometer for the analysis of irradiated nuclear fuel.
               S. Brémier, R. Hasnaoui, S. Portier and C.T. Walker

-   Microstructural characterisation of a nitrided steel previously decarburised.
               I. Calliari, M. Dabalŕ, M. Zanesco, F. Olmi, G. Vaggelli and E. Bernardo

-   The blue pigment used in Vallemaggia (Ticino, Switzerland) in the half of the XIX century: ESEM and EDS analysis on samples of G.A. Pedrazzi and G.A. Vanoni mural paintings.
               G. Cavallo

-   Application of XPS on surface characterisation of industrial brass: comparison with EPMA and GD-OES.
               H. Chen and R. Rego

-   Factors affecting electron backscattered diffraction analysis.
               J. Chen and Z. Fan

-   Microstructure and phase composition of duplex stainless steel after heat treatment.  Characterisation by FESEM-EDX and EPMA.
               A. Corrales, C. Luna, J.F. Almagro Bello and X. Llovet

-   Analytical electron microscopy of thin nano-crystalline magnetic films fabricated by pulsed laser deposition with a 157 nm fluorine laser.
               G. Drazic, K. Zuzek, P.J. McGuiness, S. Kobe, E. Sarantopoulou, Z. Kollia and A.C. Cefalas

-   Accurate determination of trace amounts of oxygen in CrAlN hard coatings by a combination of WDS-EMPA and SIMS.
               S. Dreer, P. Wilhartitz, B. Sartory and R. Tessadri

-   EDX spectra simulation in EPMA: optimisation of excitation conditions and detection limits.
               F. Eggert

-   Quantification of thin oxynitrides with SIMS.
                U. Ehrke and H. Maul

-   XRF, EPMA and SEM-EDX quantitative chemical analyses of small glass samples.
               R. Falcone, G. Sommariva and M. Veritŕ

-   Nano-scale electrical conductivity studies of chemically etched and laser annealed indium-tin oxide films by current sensing atomic force microscopy.
               Y. Fan, M.J. Rose and A.G. Fitzgerald

-   Study of structural properties of W-Si-N ternary alloys for interdiffusion barriers.
               L. Felisari, S. Frabboni, A. Vomieri and G. Ottaviani

-   Scanning and transmission electron microscopy applied to early medieval glasses.
               E. Filippo, A. Genga, D. Manno, T. Siciliano, M. Siciliano, A. Serra, L. Famŕ, G. Micocci, A. Tepore, A. Triani, A. Mangone and C. Laganara

-   Characterisation of fibrous mineral dusts in lung samples by SEM-EDX.
               E. Fornero, E. Belluso, S. Capella, G. Ferraris, D. Bellis and S. Coverlizza

-   Valence state analysis of Ti in FeTiO₃ using soft X-ray spectroscopy with FE-EPMA and HRXRF.
               S. Fukushima, T. Kimura, K. Nishida, A.M. Vlaicu, T. Fujii, Y. Ito and M. Yamashita

-   Effect of thermo-mechanical treatment on the grain boundaries of austenitic stainless steel.
               Z. Gaál and P.J. Szabo

-   Microanalysis of glass surfaces after thermal exposure.
               O. Gedeon and K. Jurek

-   Advanced X-ray laboratory microbeam techniques applied to metallurgy: the corrosion of superheater tube.
               M. Gelfi, E. Bontempi, G. Cornacchia, R. Roberti and L.E. Depero

-   Change in contrast with low voltage on an SEM transmission electro detector.
               F. Grillon

-   Quantitative analysis of fibrous minerals in rock samples using µ-Raman mapping.
               C. Groppo, R. Cossio, P. Galinetto and R. Compagnoni

-   SEM/TEM, EPMA and µ-Raman spectroscopy applied to the characterisation of Al-, Ni- and Fe-rich serpentinites.
               C. Groppo, D. Gastaldi, C. Rinaudo and R. Compagnoni

-   Exploring hydrothermally grown potassium titanate fibres by STEM-in-SEM/EDX and XRD.
               W. Habicht, N. Boukis, G. Franz, O. Walther and E. Dinjus

-   Electron probe microanalysis (EPMA) characterisation of invisible gold particles in massive sulphides at Tasik Chini area, Pahang, Malaysia.
               J. Hafiz Abdul Aziz, T. Guan Hoe and M. Hafizi Osman

-   EBSD investigations of high iron oxide containing glass ceramics.
               R. Harizanova, G. Völksch, S. Mische, P. Pölt and C. Rüssel

-   Van Gogh’s painting grounds: quantitative determination of bulking agents (extenders) using SEM/EDX.
               R. Haswell, L. Carlyle and K. Mensch

-   High temperature reactor (HTR) fuel particle coatings: advanced characterisation techniques.
               D. Hélary, G. Maveyraud, X. Bourrat, O. Dugne and M. Pérez

-   A new method for quantitative microanalysis with a scanning electron microscope.
               P. Horny, R. Gauvin and E. Lifshin

-   SIMS analysis of electron beam damage to hydrous volcanic glass.
               M. Humphreys, S.L. Kearns and J. Blundy

-   Depth profiling of PWR steels using Ar⁺ sputtering and XPS analysis - quantification problems and sputter induced effects.
            V.A. Ignatova, S. Van den Berghe and S. Van Dyck

-   Preparation of Ni nano-particles monolayer on a polyimide substrate.
            D.H. Im, I.S. Chun, K.S. Ban, J.W. Kim, S.U. Lim, Y.H. Kim, C.K. Kim and C.S. Yoon

-   Sources of elastic scattering cross-sections for electrons and positrons over a wide energy range.
               A. Jablonski and F. Salvat

-   PRAXIS: a combined µ-XRF/µ-Raman spectrometer for use in the cultural heritage area.
               K. Janssens, W. De Nolf, M. Becucci, E. Castellucci, B. Roussel, J. Oswalt, J. Schmalz, J. Tilgner, N. Langhoff, P. Ramos, I. Ruisanchez, K. Andrikopoulos, E. Bulska, M. Kunicki and J. Zieba-Palus

-   Microanalysis on Hallstatt textiles: colour and condition.
               I. Joosten, M.R. van Bommel, R. Hofmann-de Keijzer and H. Rescheiter

-   Development of nano-tube reinforced hydroxyapatite ceramics.
               C. Kealley, A. van Riessen, R. Hart, B. Ben-Nissan and M. Elcombe

-   Secondary electron imaging of exceptionally preserved fossils at low vacuum.
            S.L. Kearns and P. Orr

-   Application of EBSD (electron backscatter diffraction) technique to high temperature oxidation study.
               B.-K. Kim and J.A. Szpunar

-   Measurements of actual area for wavelength-dispersive EPMA equipped with a thermal field emission gun.
               T. Kimura, K. Nishida and S. Tanuma

-   Chemical composition of raw materials used in pigments production.
               M. Klepka, L. Lawniczak-Jablonska, R. Minikaev, M. Jablonski, A. Wolska, Z. Spolnik, R. Van Grieken and I.N. Demchenko

-   Direct and dynamic observation of Cu double layer re-structuring on W(1110) with LEEM and new finding of irregular PEEM images.
               T. Koshikawa, A. Nakaguchi, H. Takahashi, H. Shimizu, T. Yasue and E. Bauer

-   EPMA as an investigation method of Roman coin silvering techniques.
               G. Kraft, S. Flege, F. Reiff and H.M. Ortner

-   Steps toward quantitative phase analysis of nano-crystalline samples based on electron diffraction.
            J.L. Lábár, P.B. Barna and G. Sáfran

-   Fission gas bubbles characterisation in irradiated UO₂ fuel by SEM, EPMA and SIMS.
               J. Lamontagne, L. Desgranges, Ch. Valot, J. Noirot, Th. Blay, I. Roure and B. Pasquet

-   X-ray Bremsstrahlung excitation of Kossel patterns by a Roentgen tube and a focussing polycapillary lens.
               E. Langer, S. Däbritz, W. Hauffe and M. Haschke

-   Monte Carlo simulation of X-ray emission spectra from multicomponent minerals.
               K. Lawniczak-Jablonska, M. Klepka, I.N. Demchenko and M. Jablonski

-   Preliminary results and perspectives in the production of artificial glasses as calibration standards for Li and B microanalysis.
               B. Le Fevre and L.P. Ottolini

-   Considerations for three-dimensional X-ray imaging in the CrossBeam FIB.
               E. Lifshin and J. Evertsen

-   Measurement of absolute X-ray intensities with the electron microprobe.
               X. Llovet and C. Merlet

-   Electron probe microanalysis of nitrogen incorporation in solid electrolyte LiPON and LiBONS thin films deposited by RF-magnetron sputtering under a reactive nitrogen atmosphere.
                J.-L. Longuet and Y. Hamon

-   EPMA of highly insulating HfO₂ thin films supported by conductive silicon substrates.
               M. Lulla, J. Asari, J. Aarik, K. Kukli, R. Rammula, U. Tapper, E. Kauppinen and V. Sammelselg

-   Hyperspectral mapping applied to mineral investigations.
            C.M. MacRae and N.C. Wilson

-   Effect of residual austenite on properties of high-carbon steels and their welded joints.
               A. Magasdi, Z. Gaál, J. Ginsztler, J. Dobránszky and P.J. Szabo

-   The external proton microprobe at the Tandem Laboratory in Florence.
               M. Massi, L. Giuntini and P.A. Mandň

-   Development of SiGe bulk and thin film compositional standards with wavelength-dispersive electron probe microanalysis.
            R.B. Marinenko, S. Turner, L. Richter, L. Yu, R. Zeissler and D. Simons

-   Synthesis and characterisation of doped and un-doped zinc oxide nanostructures.
            K.E. McBean, M.R. Phillips and E.M. Goldys

-   The application of focussed ion beam secondary ion mass spectrometry to the characterisation of micron-scale particles.
            D.S. McPhail and R.J. Chater

-   Cathodoluminescence in a metallurgical laboratory.
            J.C. Mercier

-   Accurate determination of the surface ionisation at low energies.
               C. Merlet and X. Llovet

-   Influence of second order lines on low accelerating voltage quantitative WDX analysis.
               V. Mikli

-   X-ray mapping and interpretation of scatter plots.
               K. Moran and R. Wuhrer

-   DualBeam automation for 3-dimensional EBSD.
            J.J.L. Mulders

-   Shave-off depth profiling for nano-devices.
               M. Nojima, M. Toi, A. Maekawa, T. Yamamoto, T Sakamoto, M. Owari and Y. Nihei

-   Calculation of the temperature rise under beam bombardment by Monte Carlo method.  Application to GaAS semiconductors.
               A. Nouiri, S. Chaguetmi and N. Belabed

-   Direct visualisation of electromagnetic microfields by superposition of two kinds of electron holograms.
               A. Ohsita, M. Okuhara, C. Matsuya, K. Hata and K. Iida

-   Combination of EPMA, µ-XRF and Monte Carlo simulations for quantitative elemental analysis of single particles.
               J. Osan, L. Vincze and S. Török

-   New analytical strategies in the SIMS quantification of light elements in silicate minerals;
            L.P. Ottolini, F. Cámara and F.C. Hawthorne

-   New orientation formation during recrystallisation of cold deformed high symmetry aluminium bicrystals.
               H. Paul

-   Orientation imaging in the SEM and TEM for the characterisation of the shear banding phenomenon.
               H. Paul, A. Morawiec, J.J. Fundenberger,and A. Piatkowski

-   Characterisation of uranium compounds after a fire.
               D. Pisson, P. Ramel and O. Dugne

-   Polymers and SEM / EDXS – results or damage?
               P. Pölt

-   First evaluation of HURRICANE software for Monte Carlo simulation - Part I: Computation principles and basic applications to homogeneous and layered targets.
               J.-L. Pouchou, N. Deslile and J. Henoc

-   First evaluation of HURRICANE software for Monte Carlo simulation – Part II: Applications to rough or porous specimen, small particle and multiphase specimen.
               J.-L. Pouchou

-   Slab-related mantle metasomatism: a SIMS investigation of the Finero phlogopite-peridotite massif.
               N. Raffone, A.M. Zanetti, L.P. Ottolini, M. Mazzucchelli, G. Rivalenti and R. Vannucci

-   Quantitative EDX microanalysis in investigation of interdiffusion in Au-Ni double layers.
               A. Rakowska, L. Litynska, R. Filipek, M. Danielewski and K. Sikorski

-   Investigation of volcanic particles by SEM-EDX.
               A. Reichmann, S. Mitsche, J.H. Obenholzner and P. Pölt

-   A new way to examine interfacial reactions of a multilayered system NiAl-Hf-HBN on a sapphire fibre.
               S. Richter, S. Kyrsta, J. Schneider and J. Mayer

-   Alloy composition and textural properties of Etruscan bronzes by non-destructive analytical techniques.
               R. Rinaldi, L. Cartechini, W. Kockelmann, P. Rocchi, S. Bonamore, I. Borgia, B. Brunnetti and A. Sgamellotti

-   Determination of carbon profiles in carburized steels by EPMA.
               F. Robaut, A. Crisci, M. Durand-Charre and D. Jouanne

-   EBSD investigations of orientation relationships between monocrystalline particles and the underlying substrate after solid state spreading.
               F. Robaut, J.-M. Missiaen, R. Voytovych and B. Gilles

-   Analysis of aluminium-magnesium diffusion couples.
               K. Robertson, P. Horny, R. Gauvin and M. Pekguleryuz

-   Characterization techniques using the variable pressure scanning electron microscope.
               K. Robertson, R. Gauvin and J. Finch

-   Quantitative EPMA study of holmium solubility in BaTiO₃.
               Z. Samardzija and D. Makovec

-   Surface and interface investigations of HfO₂ thin films.
               V. Sammelselg, R. Rammula, J. Aarik, A. Kikas, K. Kukli, J. Lu, T. Käämbre, K. Kooser, M. Lulla, A. Zakharov and I. Martinson

-   External micro-PIXE measurements of minerals in lavas from Nyiragongo Volcano (Democratic Republic of Congo).
            A.P. Santo, L. Carraresi, L. Giuntini, P.A. Mando, M. Massi and F. Taccetti

-   The L spectra of Fe and Fe₃O₄.
               A. Scheffel, A. Assmann, J. Dellith and M. Wendt

-   ESEM – in-situ heating stage experiments on the sintering behaviour of “green body” ceramics.
               M. Schmied, H. Schroettner and J. Wagner

-   Measurements of atomic constants and calibration of detectors for fundamental parameter X-ray analysis.
               F. Scholze, B. Beckhoff, M. Kolbe, M. Müller and G. Ulm

-   Comparison of 3D surface reconstruction data obtained by conventional SEM, ESEM and an infinite focus microscope (IFM).
               H. Schroettner, M. Schmied and J. Wagner

-   X-ray photoelectron investigations of the chemical structure of carbon metal nano-tubes obtained by low-temperature synthesis.
            I.N. Shabanova, L.G. Makarova, N.S. Terebova, V.I. Kodolov and A.P. Kuznetsov

-   Electrically cooled Si(Li)-detectors.
               A. Sokolov, A. Pchelintsev, A. Loupilov and V. Gostilo

-   Probing the very fast phase transition of Ge₂Sb₂Te₅ by aberration-corrected electron microscopy and electron diffraction.
            S.A. Song, D. Cockayne, C. Lang and S. Chang

-   AES studies on the Ti/N compositionally gradient film deposited onto Ti-6Al-4V alloy by reactive dc sputtering.
               T. Sonoda, A. Watazu, K. Kato, T. Yamada and T. Asahina

-   A new method for mapping of large strains in silicon.
               A. Spessot, A. Armigliato, R. Balboni, S. Frabboni and A. Benedetti

-   Simultaneous determination of composition and thickness of surface layers by EPMA and Monte Carlo simulation.
               V. Starý, K. Jurek and V. Perina

-   Pile-up correction for improved accuracy and speed of X-ray analysis.
            P.J. Statham

-   Use of SEM-EDS to detect the presence of microorganisms in evaporate rocks.
               N. Stivaletta

-   Electron-stimulated reduction of V₂O₅ and MoO₃.
            D.S. Su, C. Hébert, D. Wang, P. Pongratz and R. Schlögl

-   Local strain distribution and structural changes in nano-devices identified by convergent-beam electron diffraction.
            J.H. Suh, H.S. Kim and C.G. Park

-   A method to determine the orientation relationship between the sigma and austenite phase in duplex stainless steels from measured EBSD data.
            P.J. Szabó and T. Berecz

-   A new method of surface preparation for high spatial resolution EPMA/SEM with an Ar ion beam.
               H. Takahashi, M. Takakura, M. Mori, A. Sato, J. Boerder, W. Knoll and J. Critchell

-   Optimum design of a small size and high power X-ray source with W/Al film target by Monte Carlo simulation – Brightness and temperature in the target.
               K. Tamura, A. Yoshioka, Y. Yamaguchi and R. Shimizu

-   The energies and relative intensities of M lines.
               R. Terborg

-   EPMA and µ-SR-XRF characterisation of zeolite particles synthesized in a soil polluted by copper and treated with fused coal fly ash.
               R. Terzano, K. Janssens, O. Schalm, L. Vincze, B. Vekemans and M. Spagnuolo

-   Use of microbeam analysis for the determination of the kinetics of heavy metal sorption by crown ether based sorbents.
            L.I. Trakhtenberg, E.R. Shchukin, G.N. Gerasimov, V.F. Gromov and A.P. Morovov

-   Correlation of copper, zinc and lead with calcium in their accumulation sites in a housefly’s abdomen.
               G. Tylko, J. Borowska, Z. Banach, E. Pyza, J.F. Guambe, W. Przybylowicz and J. Mesjasz-Przybylowicz

-   Backscattering X-ray induced correction factors and spatial resolution in EPMA (EDX) analysis of stratified materials.
            E.S. Valamontes

-   Scanning X-ray microfluorescence in a SEM for the analysis of very thin overlayers.
            E.S. Valamontes and J.C. Statharas

-   Compositional analysis of 17^th – 18^th century archaeological glass fragments excavated in Mechelen, Belgium: comparison with data from neighbouring cities in the Low Countries.
               W. Van der Linden, E. Bultinck, J. De Ruytter, O. Schalm, K. Janssens, W. Devos and W. Tiri

-   Energy-resolved X-ray imaging.
            M.G. Vasin, A.E. Lakhtikov, A.P. Morovov, V.V. Nazarov and L.I. Trakhtenberg

-   A novel method of analytical transmission electron microscopy for quantifying the chemistry of planar defects and for measuring segregation to grain boundaries.
               T. Walther

-   Improved nano-scale imaging and microanalysis of materials using spherical-aberration corrected scanning transmission electron microscopes.
               M. Watanabe, A. Burrows, D.W. Auckland, C.J. Kiely and D.B. Williams

-   STEM-EDXS spectrum-imaging composition determination of nano-scale particles surrounded by matrix/support materials.
               M. Watanabe and D.B. Williams

-   Combined use of SEM in situ techniques, EBSD and FIB for material transport studies in thin metallization layers.
               H. Wendrock, K. Wetzig and S. Menzel

-   In-situ investigation of discolouration processes between historic oil paint pigments.
               R. White, M.R. Phillips, P. Thomas and R. Wührer

-   Characterisation of welding aerosols using EPMA/EDX and µ-Raman spectrometry techniques.
               A. Worobiec, Z. Spolnik, S. Potgieter-Vermaak, E. Stefaniak, S. Kiro, M. Opria and R. Van Grieken

-   AFM and SEM studies of novel Al₂O₃-Yb₂O₃ coatings deposited by sol-gel method.
               H. Xu, R. Akid, H. Wang and G. Brumpton

-   Surface morphology observations on a cast iron after liquid-solid erosion-corrosion processes by scanning electron microscopy.
               H. Xu and A. Neville

-   In situ tensile testing in the ESEM – a versatile method for polymer science and life science.
               A. Zankel, E. Stabentheiner, M. Schmied and P. Pölt

-   Measurements of X-ray transmission in amorphous silicon in the 1 – 3 keV range by EPMA (WDX) instrumentation.
               M. Zelechower, J. Grecka and J. Weszka

-   Off-line pattern metrology on top-down SEM images using grey scale morphology.
            E.N. Zois, V. Anastassopoulos and I. Raptis

Last updated: 21 April 2005

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