Forthcoming Meetings and Courses

2008

23rd – 26th June 2008, London, Great Britain

Microscience 2008
Royal Microscopical Society International Conference

The MICROSCIENCE International Conference continues to grow and, in 2008, it will boast three parallel sessions covering three inspiring themes. These are:
    ·     Characterisation and nanofabrication of advanced materials
    ·     The cell in time and space
    ·     Microscopy and analysis at the frontiers

Each day kicks-off with a high-profile plenary lecture, providing an interesting and provocative start. These are followed by sessions composed of headline invited speakers - drawn from around the world - and submitted papers.

What makes MICROSCIENCE 2008 special is that the conference theatres and exhibition are housed within a single hall. Delegates can move with ease from lectures to demonstrations and discussions with company representatives. Or, they can network in the VIP lounge, the seating areas, or in the cafes that are also housed within the hall. If you haven't been to MICROSCIENCE before, make 2008 your first.

And, if stunning science and the world's largest dedicated exhibition aren't enough, MICROSCIENCE 2008 has a great social programme. In addition to the opening night reception, there is an exclusive river cruise on Tuesday evening, and a Party on the Plaza on Wednesday night.

Further information from:
      Royal Microscopical Society
      attn. Ms. Clare Oxenbury
      37/38 St. Clements
      Oxford OX4 1AJ, Great Britain
      tel: +44-1865-25.47.60, fax: +44-1865-79.12.37, e-mail: clare@rms.org.uk
      http://www.microscience2008.org.uk/ms08/show_link1.asp

09th – 11th July 2008, Berlin, Germany

Seeing at the Nanoscale VI

6^th Annual Scientific Conference focusing on Nanostructural Imaging, Characterization, and Modification using Scanning Probe Microscopy (SPM) and Related Techniques

Further information from:
http://www.screen-sar;.com/screenmails/veeco/editeur/userimages/n_2/SEEINGVI/SeeingattheNanoscaleVI.pdf

03rd – 07th August 2008, Albuquerque, New Mexico, USA

Microscopy & Microanalysis 2008
Joint meeting of the Microscopy Society of America (MSA), the Microbeam Analysis Society (MAS), and the International Metallographic Society (IMS)

Further information from:
      Hachero Hill, Inc.
      attn. Ms. Nicole Guy
      11260 Roger Bacon Drive, suite 402
      US-20190 Reston, Virginia, U.S.A.
      tel: +1-703.964.12.40 ext. 14, e-mail: nicoleguy@mindspring.com
      http://www.msa.microscopy.com/

01st – 05th September 2008, Aachen, Germany

EMC2008
14th European Microscopy Congress

May we cordially invite you to participate in the 14th European Microscopy Congress which will be held at Aachen from September 1–5, 2008. Jointly organised by the European Microscopy Society (EMS), the German Society for Electron Microscopy (DGE) and the local microscopists from RWTH Aachen University and the Research Centre Jülich, the congress will bring together scientists from Europe and from all over the world. The venue of the meeting will be the Eurocongress Centre at Aachen, a world class congress centre which is just a short walk away from the beautiful historic city centre of Aachen.

The scientific programme committee has put together an exciting programme which covers all recent developments in the three major areas of instrumentation and methods, materials science and life science. Plenary and invited lectures will give overviews on exciting new developments and state-of-the art research in the field and will be delivered by the world leading experts. However, the success of a scientific meeting vitally depends on the number and the quality of the contributed papers and we sincerely hope that you will support this with your contributions. Special emphasis will be placed on the importance of the poster sessions and hence considerable time will be reserved for the presentation and discussion of the posters.

As in the past, EMC 2008 will host a major trade exhibition, which will bring together manufacturers of all different kinds of microscopy techniques, as well as suppliers of accessories and consumables, preparation tools, image analysis systems, and all important publishers in the field. The manufacturers will introduce their latest developments and highlight new potential applications in technical lectures which will address a general audience. In the Eurocongress Centre, the commercial exhibition will form an integral part of the Congress and will contribute to the fact that EMC 2008 will be an all-embracing source of information for anybody who is interested in microscopy.

However, Aachen is more than just a very nice venue for a conference: located close to the borders of Belgium and the Netherlands, Aachen unites tradition with progress. Charlemagne has left his mark throughout the city. The cathedral - the first monument in Germany to be included in the UNESCO Cultural Heritage list - and the gothic City Hall in which 32 German kings celebrated their coronations still form the heart of Aachen’s old city centre. Aachen is an attractive city with a distinct flair and atmosphere of its own. The unique layout of the old city centre, the important historic monuments, the wells and baths over the hottest natural springs in Europe, the bustling activity in the streets and squares, the cultural diversity and quality as well as the many recreational and leisure activities make Aachen an exciting and rewarding place to stay. We would like to treat you like a king - not only at the Congress Banquet which will be held in the Coronation Hall of our gothic City Hall.

We are looking forward to welcoming you in Aachen and to sharing with you an exciting congress and a memorable week in one of the most beautiful towns in Germany.

Further information from:
     RWTH Aachen
     Gemeinschaftslabor für Elektronenmikroskopie (GfE)
     attn. Prof. Dr. Joachim Mayer
     Ahornstrasse 55
     DE-52074 Aachen, Germany
     tel: +49-2412-802.43.45, fax: +49-241-802.23.13, e-mail: gfe@gfe.rwth-aachen.de
     http://www.eurmicsoc.org/emc2008.html

07th – 11th September 2008, Trieste, Italy

LEEM - PEEM 6
6th International Workshop on LEEM - PEEM

Further information from:
    Sincrotrone Trieste S.C.p.A
      attn. Andrea Locatelli
      Area Science Park
      IT-34012 Basovizza-Trieste, Italy
      tel: +39-040-375.87.03, fax: +39-040-37.58.77, e-mail: andrea.locatelli@elettra.trieste.it
    http://www.elettra.trieste.it/leempeem6

08th – 10th September 2008, Soest, Germany

AOFA 15 - 15
Arbeitsagung Angewandte Oberflächenanalytik

Further information from:
      Technologie- und Wissenstransfer im Kreis Soest eV
      attn. Dr. H. Paulus
      Lübecker Ring 2
      DE-59494 Soest, Germany
      tel: +49-2921-37.84.21, fax: +49-2921-37.84.29, e-mail: h.paulus@fh-swf.de

14th – 16th September 2008, Münster, Germany

SIMS Europe 2008

The 6th European SIMS workshop will offer you an extensive SIMS update. We are expecting again about 250 participants.

Recent progress in analytical applications and instrumentation as well as new results in understanding and engineering of secondary ion generation will be presented. In particular cluster bombardment and analytical challenges (ultra-shallow layers, molecular depth profiling, quantification, particles, imaging, ...) will be addressed.

Companies will present their latest developments in the exhibition which will be located in the conference area.

On Sunday, September 14, a one day short course will be organized for newcomers in the SIMS field. Fundamentals of ion generation, instrumentation and analytical applications will be addressed.

The organization of the program will follow the scope of the previous workshops. We will start again on Sunday with a Short Course. It will address fundamentals of SIMS in the morning. In the afternoon, state-of-the-art SIMS surface mass spectrometry, imaging, and depth profiling will be presented.

Emphasis will be on the analytical applications of SIMS, in well-established fields such as microelectronics and material sciences, as well as in emerging fields like life sciences and nano-technologies. Recognized invited speakers will present keynote lectures, followed by contributed papers and poster sessions.

Cluster ion bombardment will remain a most important topic. Since our last European SIMS Workshop in Münster 2006, the development has been fast and impressive - in instrumentation, analytical applications and in the development of models. Cluster ion beams are now used by the majority of SIMS laboratories worldwide, and a large number of experimental results - for a wide variety of samples as well as a wide variety of cluster ions - have been accumulated. SIMS Europe 2008 is an appropriate and timely opportunity for a critical review and assessment of these developments. We intend to do this in a dedicated workshop.

Further information from:
      University of Münster
    Physikalisches Institut
      Wilhelm-Klemm-Str. 10
      DE-48149 Münster, Germany
      tel: +49-251-8333611, e-mail: bennial@uni-muenster.de
      http://www.sims-europe.uni-muenster.de

02nd – 07th November 2008, Jeju Island, South Korea

9th Asia-Pacific Microscopy Conference

Further information from:
e-mail : huchul@snu.ac.kr
http://www.apmc9.or.kr

17th – 20th November 2008, Ghent, Belgium

ICTF14
14th International Conference on Thin Films

This conference is by far the most complete event for bringing together the scientific and technological community active in the field of coatings and thin films. It is one of the tri-annual conference series endorsed and co-organised by the Thin Film Division of the International Union for Vacuum Science, Technique and Applications “IUVSTA”. This union represent nearly 15000 physicists, chemists, material scientists, engineers and technologists from all over the world, all linked together through their common use of vacuum.

Newcomers as well as experienced researchers will have the possibility to broaden their scope in the ever growing field of coatings and thin films. Without loosing the focus on thin films as such, this 14th edition will also cover new aspects as the interaction biology-coatings and nanoscience-coatings. Among the main topics of the sessions for the Congress is also:

Characterization and Instrumentation

Focused Ion Beams used to modify and analyze the surface and interface
Application of scanning probe techniques
In situ real time techniques
Imaging

Further information from:
      Ghent University
      Department of Solid State Sciences
      ICTF14
    Krijgslaan 281/S1
      BE-9000 Gent, Belgium
      e-mail : ictf14@Ugent.be
    http://www.ictf14.ugent.be/

2009

10th – 14th May 2009, Gdansk, Poland

EMAS 2009
11th European Workshop on Modern Developments and Applications in Microbeam Analysis

The main topics of the Eleventh Workshop (EMAS 2009) will be electron probe microanalysis, analytical electron microscopy, scanning electron microscopy, synchrotron-based microanalysis techniques, surface analysis, and Monte Carlo simulations. Time will also be devoted to problem orientated application of microbeam analysis techniques in fields such as catalysts, coatings, composites, glass, sensors, and in biology, cultural heritage, environment, forensics, geology, mineralogy, metallurgy, microelectronics, surfaces and interfaces, etc.

Further information from:
      EMAS Secretariat
      c/o University of Antwerp
      Department of Chemistry, MiTAC
      Attn. Mr. Luc Van't dack
    Campus Drie Eiken, Universitatsplein 1
      BE-2610 Antwerp-Wilrijk, Belgium.
      tel: +32-3-820.23.43, fax: +32-3-820.23.43, e-mail: Luc.Vantdack@ua.ac.be
      http://www.emas-web.net/

26th –30th July 2009, Richmond, Virginia, USA

Microscopy & Microanalysis 2009
Joint meeting of the Microscopy Society of America (MSA) and the MicroBeam Analysis Society (MAS), and the International Metallographic Society (IMS)

30th August – 04th September 2009, Graz, Austria

Microscopy Conference 2009
Joint meeting of the 9th Multinational Congress on Microscopy and the Dreiländertagung 2009

Austrian Society for Electron Microscopy
Croation Society for Electron Microscopy
Czechoslovak Microscopy Society
Hungarian Society for Microscopy
Italian Society of Microscopical Sciences
Serbian Society for Microscopy
Slovene Society for Microscopy
German Society for Electron Microscopy
Swiss Society for Optics and Microscopy

The Microscopy Conference 2009 in Graz is joining up the “Multinational Congress on Microscopy” and the “Dreiländertagung” both having established a strong reputation as key events in the European and international microscopy communities. MC 2009 will continue this successful tradition in Graz, a city in the centre of Europe that has a long history in science, engineering and culture.

The scientific programme of MC 2009 will comprise plenary lectures, symposia, poster presentations, and tutorials. A high quality Trade Exhibition will be a main part of MC 2009 with a mixture of exhibits and technical workshops to enable delegates to interact with vendors and witness the latest developments in microscopy in the physical and life sciences, and nanotechnology.

It is our aim to encourage the participation of young scientists; therefore several fellowships will be offered and
the conference fee for students will be below € 100,–.

There will be poster prize awards in different scientific fields.

Further information from:
      Ferdinand Hofer
      Graz University of Technology
      Steyrergasse 17,
      A-8010 Graz, Austria
      tel: +43 316 873 83 20, fax: +43 316 81 15 96, e-mail: sekretariat@felmi-zfe.at
      http://www.microscopy09.tugraz.at/

14th – 18th September 2009, Karlsruhe, Germany

ICXOM20
20th International Congress on X-ray Optics and Microanalysis

This is the second time a congress of this series is held in Germany, the last time being in 1968 in Tübingen. ICXOM20 is dedicated to providing a platform for discussion and information exchange for users and experts from the field of micro (nano) analysis by means of X-ray beams (with an emphasis in 2009 on synchrotron sources), electrons or other energetic particles. The ICXOM20 target audience is both persons already involved in these fields, as well as newcomers. Presentations of new scientific results from scientists involved in fundamental and applied research from these fields or active in methodological and instrumental developments will be made by invited and contributing speakers, demonstrating recent progress. ICXOM20 provides attendees an excellent opportunity to establish or renew contacts with colleagues during the scientific programme, the poster session, the excursion programme, or at the industrial exhibitions. Topics to be dealt with are:

Quantitative and multi-variate analysis
X-ray optics (monochromators & multilayers, focusing optics)
Modern micro- and nano- analysis
Imaging techniques and image processing
Advances in instrumentation, detection, and methodology
Applications of nano-, micro-, and surface analysis techniques

Satellite seminar: "Introduction to synchrotron-based micro & nano analysis and imaging techniques"

The ICXOM20 programme includes one seminar day on synchrotron-based micro/nanoanalysis and imaging methods for students and beginners in, on Monday, September 14, 2009 before the official ICXOM20 programme begins. Participation is limited to 25 persons and is on a first come, first serve basis. The following lecture topics will be covered:

Synchrotron radiation, its generation and properties
X-ray physics and coherent methods
X-ray optics and interferometrics
X-ray imaging
Spatially resolved synchrotron-based X-ray fluorescence analysis
Microstructure technology

Further information from:
      Forschungszentrum Karlsruhe GmbH
    Institut für Nukleare Entsorgung
      attn. Dr. Melissa A. Denecke
      P.O. Box 3060
      DE-76021 Karlsruhe, Germany
      tel: +49-7247-82.55.36, e-mail: ICXOM20@ine.fzk.de
      http://icxom20.fzk.de

2010

03rd – 07th August 2010, Portland, Oregon, Virginia, USA

Microscopy & Microanalysis 2010
Joint meeting of the Microscopy Society of America (MSA) and the MicroBeam Analysis Society (MAS), and the International Metallographic Society (IMS)

Updated 22 June 2008

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