Forthcoming Meetings and Courses

2012

15th - 17th May 2012, Golden, Colorado, U.S.A.

2012 Microanalytical Reference Materials - A MAS topical conference on reference materials for use in microanalytical measurements

Often the most valuable possession of a microanalytical lab is not the expensive instrumentation but rather its inventory of microanalytical reference materials (MRM). But how good are those MRMs and how are they being used for calibration? Are MRMs that are available to the international community being used, or are in-house MRMs? Are both primary and secondary calibration MRMs being used as part of a QC programme?

More detailed investigations and comparisons of MRMs have revealed heterogeneities and values contradictory to the accepted. We will also discuss the importance of matrix matched RMs and how they can be used to evaluate interferences.

This is an opportunity for microanalysts to meet and share experiences and critically evaluate the MRMs which we are currently using, and to identify critical roadblocks to microanalysis that are related to MRMs. Presentations by those who create, develop, and certify standards are also planned. This is an opportunity for the microanalytical community to come together to discuss the most essential materials for microanalysis.

The conference will cover the following topics:
•    Needs for reference materials (RM)
•    Where to obtain RM
•    Synthesis of RM
•    REE reference materials
•    Ti in quartz and zircon RM
•    Tephrachronology Standards
•    Round robin results
•    Matrix effects in microanalysis
•    Interference and calibration strategies
•    New and old problems with natural calibration materials
•    New directions in isotopes and volatiles in microanalysis.

Further information from:
        U.S. Geological Survey
        Microbeam Laboratory
        attn. Dr. Heather Lowers
        US-80401 Golden, Colorado, U.S.A.
        tel: +1-303-236.11.84, e-mail: hlowers@usgs.gov
        http://www.csmspace.com/events/mas/

17th - 20th June 2012, University of Padua, Department of Geosciences, Padua, Italy

EMAS 2012

10th Regional Workshop on Electron Probe Microanalysis - Practical Aspects
Including a session on Electron Backscatter Diffraction

EMAS Secretariat
c/o University of Antwerp
Department of Chemistry, Research group PLASMANT
attn. Mr. Luc Van’t dack
Campus Drie Eiken, Universiteitsplein 1
BE-2610 Antwerp-Wilrijk, Belgium
tel: +32-3-265.23.43, fax: +32-3-265.23.43, e-mail: luc.vantdack@ua.ac.be
http://www.emas-web.net/

18th - 22nd June 2012, Vienna, Austria

EXRS 2012 - European Conference on X-Ray Spectrometry

The 14th EXRS conference is devoted to the exchange of information and experience on the emerging and innovative techniques in the field of X-ray spectrometry and related areas. The conference will provide a framework in which scientists of various research areas will be able to convene and discuss X-ray techniques and their successful applications. A rich
scientific and social programme will allow experienced experts, young scientists, and industrial exhibitors to exchange views and start new collaborative projects.

The EXRS 2012 conference will be hosted by the IAEA (International Atomic Energy Agency) and held in the IAEA Conference Center in the Vienna International Centre (VIC), a modern Conference Center with superb conference facilities for participants and exhibitors.
Scientists, engineers and exhibitors are invited to join the conference and share not only the ideas and current results but also their valuable experience, contributing to the enrichment of the international community.

The programme will consist of invited lectures, oral presentations, poster contributions and will include an exhibition of the manufacturers of equipment applied in the XRS field.

Conference topics:
• Interactions of X-rays with matter and fundamental parameters
• X-ray sources, optics and detectors
• Quantification methodology
• TXRF, GIXRF and related techniques
• Microbeam techniques
• Mobile and portable XRF
• WDXRS
• Synchrotron XRS
• PIXE and electron induced XRS
• Recent scientific developments by XRS instrument manufacturers
• X-ray imaging and tomography
• High resolution X-ray absorption and emission spectroscopy
• XRS Applications:
o Advanced materials and nanoscience
o Art and cultural heritage
o Earth and environment sciences
o Industrial quality and process control
o Life sciences and forensics
Further information from:

Atominstitut TU Wien
EXRS-2012 Secretariat
Stadionallee 2
AT-1020 Wien, Austria
e-mail: exrs2012@ati.ac.at
http://www.ati.ac.at/EXRS2012/

19th - 21st June 2012, Carnegie Melon University, Pittsburgh, Pennsylvania, USA

EBSD 2012
An MAS Topical Conference on Electron Backscatter Diffraction

Further information from:
http://nritchie.quintagroup.com/www/topical-conferences/ebsd-2012/

09th - 13th July 2012, Chicago, Illinois, U.S.A.

Inter/Micro 2012

Further information from:
http://www.mrci.org/home/section/101/inter-micro

29th July – 02nd August 2012, Phoenix, Arizona, USA

Microscopy & Microanalysis 2012

Joint meeting of the Microscopy Society of America (MSA) and the MicroBeam Analysis Society (MAS), and the International Metallographic Society (IMS)

Further information from:
      Hachero Hill, Inc.
      attn. Ms. Nicole Guy
      11260 Roger Bacon Drive, suite 402
      US-20190 Reston, Virginia, U.S.A.
      tel: +1-703.964.12.40 ext. 14, e-mail: nicoleguy@mindspring.com
      http://www.msa.microscopy.com/

06th - 10th August 2012, Denver, Colorado, U.S.A.

Denver X-ray Conference

Further information from:
e-mail: flaherty@icdd.com
http://www.dxcicdd.com/12/index.htm

09th - 11th September 2012, Münster, Germany

SIMS Europe 2012

The 8th European Workshop on Secondary Ion Mass Spectrometry - SIMS Europe 2012, will be held at the University of Münster. Alternating with the biennial International SIMS Conferences, the European Workshop is attended by an increasing number of participants, exceeding 230 in the past years, indicating that it meets the needs of the European as well as of the international SIMS community.

Once again, the Workshop will take place in the main building of the Physics Department, with comfortable access to the student cafeteria and other restaurants. Accommodation will be organized by “Münster Marketing”. The conference fee is €100 for regular attendants and €50 for students.

The programme will be organized along the lines of previous workshops. Again, Sunday starts off with a Short Course. In the morning, SIMS fundamentals will be addressed. In the afternoon, state-of-the-art SIMS surface mass spectrometry, imaging, depth profiling, and chemometric methods will be presented. This Short Course is free of charge.

The emphasis of this meeting will be on fundamental research, including sputtering and ionisation processes, cluster ion bombardment, molecular depth profiling, and ultrahigh spatial resolution SIMS. The conference will also focus on analytical applications of SIMS in well-established fields such as nanoelectronics, materials sciences, life sciences, and nanotechnologies. Invited speakers of international standing will present keynote lectures, followed by contributed papers and poster sessions.

Further information from:
SIMS Europe 2012
University of Münster
Physikalisches Institut
Wilhelm-Klemm Strasse 10
DE-48149 Münster, Germany
e-mail: contact@sims-europe.eu
URL: http://www.sims-europe.eu/

16th – 21st September 2012, Manchester Central, Manchester, UK

European Microscopy Congress (emc2012)

The UK microscopy community looks forward to welcoming you to Manchester in September 2012. With an international conference of the highest quality sitting alongside Europe's largest exhibition dedicated to microscopy, it promises to be a truly memorable event. Added to this will be great training opportunities, a programme of technical workshops, and a full social programme. Put the date in your diary and start looking forward to a true festival of microscopy in one of the UK's most exciting and vibrant cities.

The EMC 2012 Conference will attract invited speakers from all over the world. The multi‑theme programme will cover life and materials science, instruments and techniques, and new frontiers in microscopy. And, it will strike a firm balance between electron, light and other microscopies.

Further information from:
      Royal Microscopical Society
      37/38 St. Clements Street
      Oxford OX4 1AJ, Great Britain
      tel: +44-1865-25.47.60, e-mail: emc2012@rms.org.uk
    http://www.emc2012.org.uk/

2013

12th - 16th May 2013, Porto, Portugal

EMAS 2013

13th European Workshop on Modern Developments and Applications in
Microbeam Analysis

Further information from:
EMAS Secretariat
c/o University of Antwerp
Department of Chemistry, Research group PLASMANT
attn. Mr. Luc Van’t dack
Campus Drie Eiken, Universiteitsplein 1
BE-2610 Antwerp-Wilrijk, Belgium
tel: +32-3-265.23.43, fax: +32-3-265.23.43, e-mail: luc.vantdack@ua.ac.be
http://www.emas-web.net/

04th – 08th August 2013, Indianapolis, Indiana, USA

Microscopy & Microanalysis 2013
Joint meeting of the Microscopy Society of America (MSA) and the MicroBeam Analysis Society (MAS), and the International Metallographic Society (IMS)

05th - 09th August 2013, Denver, Colorado, U.S.A.

Denver X-ray Conference

Further information from:
e-mail: flaherty@icdd.com
http://www.dxcicdd.com/

25th - 30th August 2013, Regensburg, Germany

MC 2013 - Microscopy Conference / Dreiländertagung

The Microscopy Conference MC 2013 will be organized by the Microscopy Societies of the nine countries (DGE – German Society for Electron Microscopy; ASEM – Austrian Society for Electron Microscopy; SSOM – Swiss Society for Optics and Microscopy; SISM – Italian Society of Microscopical Sciences; CSMS – Czechoslovak Microscopy Society; MMT – Hungarian Society for Microscopy; SSM – Serbian Society for Microscopy; CSEM – Croatian Society for Electron Microscopy; SDM – Slovene Society for Microscopy).

It is the 8th conference in the series of the Dreiländertagungen, organized by D-A-CH, and the 2nd which is to be organized as a Nine-Country-Meeting, with the societies of the MCM as co-organizers. The official conference language will be English. Reduced conference fees will be available to members of all participating Societies for Microscopy. The status of an EMS extension for MC 2013 will be requested.

Topics will include:

• Instrumentation and methods;

• Materials science;

• Life sciences.

Further information from:

Conventus Congressmanagement & Marketing GmbH

attn. Ms. Francesca Rustler

Carl-Pulfrich Strasse 1

DE-07745 Jena, Germany

tel: +49-3641-31.16.33.66, fax: +49-3641-311.62.43, e-mail: francesca.rustler@conventus.de

http://www.mc2013.de/

2014

08th – 11th August 2014, Hartford, Connecticut, Indiana, USA

Microscopy & Microanalysis 2014
Joint meeting of the Microscopy Society of America (MSA) and the MicroBeam Analysis Society (MAS), and the International Metallographic Society (IMS)

Further information from:
      Hachero Hill, Inc.
      attn. Ms. Nicole Guy
      11260 Roger Bacon Drive, suite 402
      US-20190 Reston, Virginia, U.S.A.
      tel: +1-703.964.12.40 ext. 14, e-mail: nguy@conferencemanagers.com
      http://www.msa.microscopy.com/

21st - 25th September 2014, Prague, Czech Republic

18th International Microscopy Congress

Further information from:
e-mail: info@imc2014.com
http://www.imc2014.com/imc.html

Updated 26th April 2012

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