Forthcoming Meetings and Courses

FOM 2010
23rd International Conference od 3D Image Processing in Microscopy, and 22nd International Conference on Confocal Microscopy

After the successful FOM2009 conference held in Krakow,

Poland

this year, it is a pleasure to announce the next conference Focus on Microscopy 2010. As the next in this series of unique interdisciplinary meetings on advanced multi-dimensional light microscopy and image processing. The conference will be organized under the support of the Shanghai Jiao Tong University in Shanghai at the Shanghai Everbright Convention and Exhibition Center, in the centre of Shanghai.

Focus on Microscopy 2010 is the continuation of a yearly conference series presenting the latest innovations and new trends in optical microscopy and their application in biology, medicine and material sciences. A technical exhibition will be a feature of the Shanghai FOM2010 conference. Key subjects are:

· the high spatial resolution (SIM, STED, PALM, etc.) methods, sophisticated excitation (SHG, Raman, THG, OCS), and fluorescence imaging modes (FRET,FLIM, FRAP, FCS) coming available

Further information from:
      Shanghai Jiao Tong University
Inst. for Laser Medicine and Bio-Photonics
attn. Dr. Qiushi Ren
800 Dongchuan Road
    CN-200240 Shanghai, P. R. China
tel: +86-21-34.20.40.80, fax: +86-21-34.20.40.78, e-mail: info2010@FocusOnMicroscopy.org
      http://www.FocusOnMicroscopy.org

EMAS 2010
9th Regional Workshop on Electron Probe Microanalysis Today - Practical Aspects
with emphasis on microbeam analysis for cultural heritage

The EMAS Regional Workshops are biennial events designed to provide postgraduate-level and research workers in materials science and material engineering with basic knowledge of the capabilities and limitations of electron probe X-ray microanalysis. The workshops are arranged as low-budget meetings with lectures on practical and theoretical aspects of EPMA given by internationally recognised experts. The format and content of the meetings are tailored to the needs of the practical microanalyst routinely dealing with problems of specimen preparation, instrumental procedures, data collection and quantification, as well as those of research workers keen to obtain a deeper understanding of the physics underlying X-ray production, measurement and analysis.

• Electron beam - specimen interactions
• X-ray spectroscopy
• Quantitative electron probe microanalysis
• Light element analysis
• Basic Monte Carlo simulation
• Electron backscatter diffraction
• Sample preparation

Since the Netherlands Institute for Cultural Heritage (ICN) has an ongoing interest in cultural heritage related microbeam analysis, the Workshop will include two technical sessions dedicated to this subject.

Topics covered in these sessions dealing with cultural heritage microanalysis will include:

• Non-invasive analysis of cultural heritage objects
• Multispectral imaging and IR reflectography of paintings
• Scanning μ-X-ray fluorescence
• Variable pressure scanning electron microscopy
• Identification of pigments and dyestuffs by μ-Raman
• Integrated X-ray diffraction and X-ray fluorescence
• Laser ablation inductively coupled plasma mass spectrometry

Further information from:
      EMAS Secretariat
      c/o University of Antwerp
      Department of Chemistry, Research Group PLASMANT
      Attn. Mr. Luc Van't dack
    Campus Drie Eiken, Universitatsplein 1
      BE-2610 Antwerp-Wilrijk, Belgium.
      tel: +32-3-265.23.43, fax: +32-3-265.23.43, e-mail: Luc.Vantdack@ua.ac.be
      http://www.emas-web.net/

The GRC on 3-D electron microscopy has recently doubled it’s meeting frequency from being held every two years in the US to an annual event alternating between the US and Europe. This development clearly demonstrates the strong interest in 3DEM methods and applications for biological specimens, and that the conference serves a growing community. In particular, since the rediscovery of (cryo-)electron tomography for large cellular structures the demand for 3DEM has literally exploded despite a current limitation in resolution to approx. 2 nm due to technical limitations. On the other end, recent work has shown that electron microscopy data of biological structures may reach atomic resolution beyond 0.2 nm. In-between these two extremes hybrid methods, combining intermediate resolution EM 3D maps with X-ray, NMR or even in-silico data have been improved tremendously and generated a lot of excitement for thorough investigations into protein structure and function relationships. Obviously these developments are as usual accompanied and made possible by new products from the relevant industries ranging for microscope technology (LHe-lenses, corrector lenses, energy filtering, phase-plates improved stages) to detector design (lens-coupled CCD systems, CMOS detectors etc.). At the same time data acquisition and image analysis software products are constantly improved and refined, playing their crucial role on the data handling and interpretation front.

Further information from:
      University of Colorado
      Dept. of Mol. Cell. Dev. Biology
      attn. Dr. Andreas Hoenger
      US-80309-0347 Boulder, Colorado,

U.S.A.

tel: +1-303-735.08.44, e-mail: andreas.hoenger@colorado.edu
http://www.grc.org/programs.aspx?year=2010&program=threedim

The conference is devoted to the exchange of emerging and inventive X-ray spectrometry techniques and related areas, as well as to their important applications. Beginning in 1984, the EXRS conferences have been held in Goteborg, Vienna, Antwerp, Myconos, Budapest, Lisbon, Bologna, Krakow, Berlin, Alghero, Paris, and last in the Croatian city of Dubrovnik.

The University of Coimbra, Portugal, welcomes the 14th forum of a biannual series of conferences on X-ray spectrometry.

Topics of interest at the meeting include:
·    Interactions of X-rays with matter and fundamental parameters;
·    X-ray sources, optics and detectors;
·    Quantification methodology;
·    TXRF, GIXRF and related techniques;
·    Microbeam techniques;
·    Mobile and portable XRF;
·    WDXRS;
·    Synchrotron XRS;
·    PIXE and electron induced XRS;
·    Recent scientific developments by XRS instrumentation manufacturers;
·    X-ray imaging and tomography;
·    High-resolution X-ray absorption and emission spectroscopy;

XRS applications such as: advanced materials and nanoscience, art and cultural heritage, earth and environment sciences, industrial quality and process control, and life sciences and forensics.

Further information from:
      University of Coimbra
      Physics Department, ADDF
      Rua Larga
      PT-3004-516 Coimbra, Portugal

tel: +351-239-41.01.01, e-mail: exrs2010@fis.uc.pt
http://exrs2010.fis.uc.pt/

This event will combine a themed conference with special 'hands on' workshops, a Learning Zone and the largest European exhibition of the latest equipment in microscopy and imaging. The three day conference programme will include four parallel sessions covering the broadest range of microscopy techniques, applications and image analysis. This will run alongside the world’s largest dedicated exhibition with over 100 companies revealing all that is new in imaging and microscopy.

Further information from:
      Royal Microscopical Society
      attn. Ms. Clare Oxenbury
      37/38 St. Clements
      Oxford OX4 1AJ, Great Britain
      tel: +44-1865-25.47.60, fax: +44-1865-79.12.37, e-mail: clare@rms.org.uk
      http://www.rms.org.uk/microscience.shtml

Further information from:
    c/o Event Planners Australia
      P.O. Box 1517
      AU-4009 Eagle Farm, Queensland,

Australia

tel: +61-7-38.58.55.18, fax: +61-7-38.58.54.99, e-mail: info@accm21.com.au
http://www.accm21.com.au/

Microscopy & Microanalysis 2010
Joint meeting of the Microscopy Society of America (MSA) and the MicroBeam Analysis Society (MAS), and the International Metallographic Society (IMS)

Further information from:
      Hachero Hill, Inc.
      attn. Ms. Nicole Guy
      11260 Roger Bacon Drive, suite 402
      US-20190 Reston, Virginia, U.S.A.
      tel: +1-703.964.12.40 ext. 14, e-mail: nicoleguy@mindspring.com
      http://www.msa.microscopy.com/

Bringing together, through all forms of microscopy, the frontiers of nanotechnologies and applications, medicine and life sciences, energy conversion, environmental protection and much more …

The International Microscopy Congress (IMC) held every four years under the auspices of International Federation of Societies for Microscopy (IFSM) has been providing an international forum for the state of the art of microscopy at the frontiers of research and applications in Materials Sciences and in Life Sciences. The Brazilian Society for Microscopy and Microanalysis (SBMM) is proud and happy to host the IMC 17. Brazil covers the majority of the South American Continent and Rio de Janeiro is an exuberant and cosmopolitan city with very pleasant weather in September. Easy access from all over the world, allows participation of delegates from all the IFSM affiliates societies to come to friendly Rio and feel at home.

16. Arbeitstagung Angewandte Oberflächenanalytik AOFA
5th Symposium on Vacuum based Science and Technology

The theme of these renowned conferences, which will run concurrently this time, is “Vacuum meets Surface”. Both events are organized jointly by the IFOS and the DVG in Kaiserslautern.

The intention of focussing on the complementing subject matter of the conferences is, to allow the attendees and the exhibitors to concentrate their resources, while at the same time providing more information to the participants and enlarging the forum of discussion for them to ensure an efficient and target-oriented organisation.

Further information from:
    IFOS GmbH
attn. U. Asal / C. Zimmer
    Trippstadter Strasse 120
    DE-67663 Kaiserslautern,

Germany

tel.: +49-(0)631-20.57.30, fax: +49-(0)631-205.73.30.03, e-mail: aofa@ifos.uni-kl.de
http://www.ifos.uni-kl.de/AOFA

The fourth edition of Synchrotron Radiation in Art and Archaeology (SR2A-2010) will be organized by the Department of Materials Science of Delft University of Technology and the Department of Chemistry of the University of Antwerp, in collaboration with the Rijksmuseum, the ICN - Instituut Collectie Nederland, and the van Gogh Museum. These organisations kindly invite you in the fall of 2010 to attend this European conference on non-destructive X-ray analysis of museum objects and related materials.

Since the first edition of the conference (Grenoble,

France

, 2005), SR2A has become a forum for discussion and presentation of up-to-date activities in Europe regarding the use of penetrant forms of radiation for non-invasive inspection and analysis of precious materials from the past. The past SR2A conferences have been held at or close to synchrotron facilities (ESRF, Grenoble; BESSY, Berlin; ALBA, Barcelona). In order to strengthen the cross-disciplinary ties in our community, the fourth edition of SR2A will take place on and around the museum square in Amsterdam, where leading Dutch museums and cultural heritage institutes are located.

The emphasis of the fourth edition of SR2A will be placed on the manner in which synchrotron radiation and other types of penetrative radiation (THz, neutrons, ...) can be used together to characterize artists' materials and archaeological artefacts. Contributions will focus on the exploration of new analytical frontiers on the one side, but will also address research challenges of curators, conservators and other professionals working in the cultural heritage field.

Further information from:
      University of Antwerp
      Department of Chemistry, Research group PLASMANT
      attn. Mr. Luc Van’t dack
      Campus Drie Eiken, Universiteitsplein 1
      BE-2610 Antwerp-Wilrijk,

Belgium

tel: +32-3-265.23.43, fax: +32-3-265.23.43, e-mail: luc.vantdack@ua.ac.be
http://www.sr2a.ua.ac.be/

EMAS 2011
12th European Workshop on Modern Developments and Applications in Microbeam Analysis

Further information from:
      Samsung Advanced Institute of Technology
      Analytical Engineering Center
      attn. Dr. Se Ahn Song
    P.O. Box 111
      KR-440-600 Suwon, South Korea
      e-mail: sasong@samsung.com

Microscopy & Microanalysis 2011
Joint meeting of the Microscopy Society of America (MSA) and the MicroBeam Analysis Society (MAS), and the International Metallographic Society (IMS)

Microscopy & Microanalysis 2012
Joint meeting of the Microscopy Society of America (MSA) and the MicroBeam Analysis Society (MAS), and the International Metallographic Society (IMS)

Microscopy & Microanalysis 2013
Joint meeting of the Microscopy Society of America (MSA) and the MicroBeam Analysis Society (MAS), and the International Metallographic Society (IMS)