Forthcoming Meetings and Courses
2009
24th
– 25th June
2009, Paris, France
11ième Colloque de la Société
Française des Microscopies (GN-MEBA)
Les
matériaux d'hier et d'aujord'hui: apport de la microscopie
à balayage et des microanalyses associées
Mercredi
24 Juin 2009
Microscopie et métaux
- Influence
d'un traitement thermomécanique complexe sur les
évolutions microstructurales
et les propriétés élastiques et acoustiques
associées dans le cas d'un alliage
de cuivre utilisé dans la fabrication d'instruments de musique.
Brigitte
BACROIX (Université Paris 13,
LPMTM, Villetaneuse)
- Les
microscopies au service du patrimoine : études de cas
traitées au
laboratoire EDF-Valectra.
Emmanuelle
PONS (EDF R&D, Moret sur
Loing)
- Utilisation
du MEB dans l'étude de la solidification d'alliages.
Dominique
DALOZ (Institut J. Lamour, Nancy)
- Les
aciers damassés décryptés.
Madeleine
DURAND-CHARRE (INP,
SIMAP-Grenoble, Meylan)
Microscopie et
minéraux
- Utilisation
de la microstructure comme critère d'identification du
procédé de fabrication
des verres anciens opacifiés aux antimoniates de calcium.
Sophia LAHLIL
(Laboratoire du Centre de
Recherche et de Restauration des Musées de France, Paris)
- Microscopie
électronique et géosciences : de l'origine de la terre
à sa préservation.
Guillaume
WILLE (BRGM, Orléans)
- Applications
de la microanalyse à l’étude des
météorites.
Albert JAMBON
(Laboratoire Magie, Paris)
- Minéralogie
quantitative (MLA) : application au minerai de manganèse.
Emilie BAILLET (CRT Groupe
ERAMET,
Trappes)
Symposium commun GN MEBA-SFµ : Microscopies
alternatives
- Tomographie
atomique laser et nanosciences.
Didier
BLAVETTE (Universté de Rouen, GPM,
Rouen)
- MEB
- STEM et applications biologiques.
François
GRILLON (ENSMP, Evry) et Philippe
HALLEGOT (L'Oréal, Aulnay sous Bois)
- titre
à préciser.
Laurent LEGRAS
(EDF R&D, Moret sur
Loing)
- Spectroscopie
Raman et nano-structures.
Maximilien
CAZAYOUS (Université Paris
Diderot-Paris 7, MPQ)
Jeudi
25 Juin 2009
Microscopie et
êtres vivants
- Structures
photoniques multi échelles naturelles.
Serge BERTHIER
(Université Paris
Diderot-Paris 7, Institut Des Nanosciences)
- Cosmétique.
Sylvie MARULL
(Centre de Recherche Yves
Rocher, Issy les Moulineaux)
- Application
du MEB à pression contrôlée et de la microanalyse X
à la détection de la tuberculose
osseuse.
Jean DÜRR
et Lahcen KHOUCHAF (CPN, Douai)
- Microscopie
électronique et carpologie.
Erwan MESSAGER
et Brigitte DENIAUX (Maison
de l'Archéologie et de l'Ethnologie, Nanterre)
Microscopie et nouveaux matériaux
- Apport
de la microscopie électronique à balayage couplée
à l'interférométrie à lumière
blanche lors de l'étude de revêtements anticorrosion
à base de polymères dopés.
Claire ARNOULT
(CRP Henri Tudor, Luxembourg)
- Formation
de précipités d'argent après recuit à l'air
de films minces à base d'oxydes.
Jean-François
PIERSON (Institut J. Lamour, Nancy)
- Apport
de la microscopie électronique à l'étude des
électrodes composites de batteries
au lithium.
Philippe
MOREAU (ST2E, Nantes)
- Les
techniques microscopiques pour l'identification de l'origine de pertes
de
performance dans des cellules photovoltaïques à basse de
CIS.
Veronica
BERMUDEZ (IRDEP, Chatou)
- Apport
de la microscopie électronique à balayage pour la
conception d'aile de
microdrone.
Agnès
LUC-BOUHALI (ONERA, Palaiseau)
Further information from:
http://mr.gnmeba.free.fr/reunions_th.htm
26th
–30th July
2009, Richmond, Virginia, USA
Microscopy
&
Microanalysis 2009
Joint
meeting of the Microscopy Society of
America
(MSA) and the MicroBeam Analysis Society (MAS), and the International
Metallographic Society (IMS)
Further
information from:
Hachero
Hill, Inc.
attn.
Ms. Nicole Guy
11260 Roger Bacon
Drive, suite 402
US-20190 Reston, Virginia,
U.S.A.
tel:
+1-703.964.12.40 ext. 14,
e-mail:
nicoleguy@mindspring.com
http://www.msa.microscopy.com/
30th
August – 04th September
2009, Graz, Austria
Microscopy
Conference 2009
Joint
meeting of the 9th Multinational Congress on Microscopy and the
Dreiländertagung 2009
The Microscopy Conference 2009 in Graz is joining up the “Multinational Congress on Microscopy” and the “Dreiländertagung” both having established a strong reputation as key events in the European and international microscopy communities. MC 2009 will continue this successful tradition in Graz, a city in the centre of Europe that has a long history in science, engineering and culture.
The scientific programme of MC 2009 will comprise plenary lectures, symposia, poster presentations, and tutorials. A high quality Trade Exhibition will be a main part of MC 2009 with a mixture of exhibits and technical workshops to enable delegates to interact with vendors and witness the latest developments in microscopy in the physical and life sciences, and nanotechnology.
It
is our aim to
encourage the participation of young scientists; therefore several
fellowships will be offered and
the conference fee for students will be below €
100,–.
There will be poster prize awards in different scientific fields.
Further
information from:
Ferdinand
Hofer
Graz University
of Technology
Steyrergasse 17,
A-8010 Graz,
Austria
tel:
+43 316 873 83 20, fax: +43 316 81 15 96,
e-mail:
sekretariat@felmi-zfe.at
http://www.microscopy09.tugraz.at/
08th
– 11th September
2009, Sheffield, Great Britain
EMAG
2009
Microscopy at
the Nanoscle and Beyond
Electron microscopy is currently in a period of rapid technological development, with advances such as aberration correctors, monochromators, developments in focused ion-beam instruments, and new detector technologies opening many new research avenues. Alongside these come developments in existing techniques and the invention of new techniques. All these advances are broadening the range of electron microscope application at a time when the ever shrinking dimensions of new technologies require it.
The Electron Microscopy and Analysis Group’s (EMAG) biennial conference has established a strong reputation as a key event in the calendars of the national and international microscopy communities, since its inaugural meeting in 1946 (then known as the Electron Microscopy Group). It has always sought to capture the latest in the development and applications of electron microscope techniques.
EMAG 2009 will continue this tradition in Sheffield, a city well known for materials development. The central location of Sheffield means that EMAG 2009 will be easily accessible for day visitors as well as for delegates attending the whole conference and the advanced school.
A high quality Trade Exhibition is at the heart of an EMAG conference and EMAG 2009 will build on the success of the Exhibition at Glasgow in 2007 with a mixture of exhibits and technical workshops to enable delegates to interact with vendors and witness the latest developments in microscopy and nanotechnology.
The scientific themes of EMAG 2009 will be addressed through invited and contributed oral and poster presentations. The plenary lectures will be delivered by Prof. D.J.H. Cockayne, University of Oxford, Prof. D.C. Joy, University of Tennessee, and Prof. G. Van Tendeloo, University of Antwerp. One of the principal features of the conference is the opportunity it gives to young researchers to present their work through both the symposia and the poster sessions. There will be prizes for the best student contributions.
A one-day advanced school on the subject of
Nanofabrication
and Nanomanipulation will be held on Tuesday 8 September to enable
young
researchers to expand their knowledge in a key subject theme of the
conference.
The themes of
EMAG 2009 will be:
· Avanced
electron microscopy techniques
· Investigating
structure-property relationships in advanced materials
· Nanophysics
and nanotechnology.
Oral and poster contributions within any of these
themes are
invited. These may address topics such
as:
· 3-D
microscopy
· Aberration
corrected microscopy
· Advances
in SEM & FIB (CL, EBSD, energy-filters)
· Biological
materials
· Catalytic
materials
· Detector
technologies
· Electron
crystallography
· Functional
materials
· Geological
microscopy
· High
spatial resolution chemical and structural analysis
· Imaging
dynamic processes
· Interfacial
analysis
· In-situ
microscopy techniques
· Nano-materials
· Surface
imaging and modification
· Structural
materials.
Further information from:
The Institute
of Physics
attn.
Ms. Claire Garland
76
Portland Place
London
W1B 1NT, Great Britain
tel:
+44-20-74.70.48.00, fax:
+44-20-74.70.49.00, e-mail:
claire.garland_AT_iop.org
http://www.emag2009.org/
13th
– 18th September
2009, Toronto, ON, Canada
SIMS XVII
17th
International
Conference on Secondary Ion Mass Spectrometry
The biennial International SIMS Conference is the premier international forum for reporting new results and sharing practical information about SIMS and its related techniques as well as providing an informal atmosphere to encourage extended discussions. An extensive vendor program has been planned which will include an exhibition for components, data systems, and other commercial services.
The topical subjects will cover all aspects of the SIMS and its related techniques including:
1. Fundamentals
2. Instrumentation
3. Organic materials
4. Inorganic materials
5. Bio sciences / Life sciences
6. Nanotechnology
7. Semiconductors / microelectronics
8. Organic electronics
9. Environmental sciences
10. Geology / cosmochemistry
11. Art conservation
12. Focused ion beams
13. Depth profiling
14. Dynamic SIMS
15. Imaging / data analysis
16. Cluster ion beam sources
17. Cell, bacterial and tissue imaging
18. Dynamic SIMS vs TOF SIM depth profiling
Further
information from:
Meeting
Management Services Inc.
4380
South Service Rd - Unit 25
CA-L7L
5Y6 Burlington, Ontario, Canada
tel:
+1-905-335.79.93, fax: +1-905-332.15.87,
e-mail: email@simsxvii.org
http://www.simsxvii.org
14th
– 18th September
2009, Karlsruhe, Germany
ICXOM20
20th
International
Congress on X-ray Optics and Microanalysis
This is the second time a congress of this series is held in Germany, the last time being in 1968 in Tübingen. ICXOM20 is dedicated to providing a platform for discussion and information exchange for users and experts from the field of micro (nano) analysis by means of X-ray beams (with an emphasis in 2009 on synchrotron sources), electrons or other energetic particles. The ICXOM20 target audience is both persons already involved in these fields, as well as newcomers. Presentations of new scientific results from scientists involved in fundamental and applied research from these fields or active in methodological and instrumental developments will be made by invited and contributing speakers, demonstrating recent progress. ICXOM20 provides attendees an excellent opportunity to establish or renew contacts with colleagues during the scientific programme, the poster session, the excursion programme, or at the industrial exhibitions. Topics to be dealt with are:
Satellite seminar: "Introduction to synchrotron-based micro & nano analysis and imaging techniques"
The ICXOM20 programme includes one seminar day on synchrotron-based micro/nanoanalysis and imaging methods for students and beginners in, on Monday, September 14, 2009 before the official ICXOM20 programme begins. Participation is limited to 25 persons and is on a first come, first serve basis. The following lecture topics will be covered:
Further
information from:
Forschungszentrum
Karlsruhe GmbH
Institut
für Nukleare Entsorgung
attn.
Dr. Melissa A. Denecke
P.O. Box 3060
DE-76021
Karlsruhe, Germany
tel:
+49-7247-82.55.36,
e-mail: ICXOM20@ine.fzk.de
http://icxom20.fzk.de
25th
– 28th October
2009, Rosario City, Argentina
CIASEM 2009
10th
Inter-American
Congress of Electron Microscopy
In October 2009, the 10th Inter-American Congress on Electron Microscopy (CIASEM 2009) and the 1st Congress of the Argentine Society of Microscopy (SAMIC 2009) will be held jointly in Argentina, in the city of Rosario. The CIASEM Congresses are held every two years, and are the largest and most important meetings on electron microscopy and microscopy throughout the Americas. They have previously been held in Brazil, Ecuador, Mexico (twice), Venezuela (twice), United States of America, Cuba and Peru. These congresses are sponsored by CIASEM, the Inter-American Committee of Societies for Electron Microscopy, a regional organization of IFSM, the International Federation of Societies for Microscopy, for the Western Hemisphere.
Contributions related to SEM, TEM, SPM, APT, APFIM, confocal and optical microscopies among the following areas and topics are welcome:
Physical
and Materials
Sciences
· Phase
transformation, defects and microstructures in alloys
· Nanostructures
and catalysts
· Surfaces
and thin films
· Ferroelectric,
magnetic, superconducting and
semiconducting materials
· Ceramics
· Others
Instrumentation
and
Analysis
· Diffraction,
HRTEM, tomography, holography
· SEM
and dual beam
· EELS
and EDS
· Aberration
correctors
· Confocal
microscopy
· Scanning
probe microscopies (STM, AFM, etc.)
· Image
processing and simulations
· Others
Applications
· Structural
materials and industrial applications
· Geology
· Nanotechnology
· Nuclear
materials
· Forensic
and historical applications
·
Others
Further
information from:
e-mail:
ciasem2009@cab.cnea.gov.ar
http://www.cab.cnea.gov.ar/ciasem2009
30th
November – 04th December
2009, Boston, Massachusetts, U.S.A.
The Materials Research Society
Fall Meeting
Further information from:
Materials
Research Society
506
Keystone Drive
US-15086-7573
Warrendale, Pennsylvania, U.S.A.
tel: +1-724-779.30.03, e-mail:
info@mrs.org
http://www.mrs.org/s_mrs/sec.asp?
03rd
– 04th December
2009, Paris, France
Journées pédagogiques de la
Société Française des Microscopies (GN-MEBA)
Statistiques,
erreurs, résolution, limite de détection en micro-analyse
Further information from:
http://mr.gnmeba.free.fr/reunions_p.htm
2010
25th
– 28th April
2010, Amsterdam, The Netherlands
EMAS 2010
9th Regional Workshop on Electron Probe Microanalysis Today - Practical Aspects
with emphasis on
microbeam analysis for cultural heritage
Further
information from:
EMAS
Secretariat
c/o University of
Antwerp
Department of
Chemistry, Research Group PLASMANT
Attn. Mr. Luc Van't
dack
Campus Drie Eiken,
Universitatsplein 1
BE-2610
Antwerp-Wilrijk, Belgium.
tel:
+32-3-265.23.43,
fax:
+32-3-265.23.43,
e-mail: Luc.Vantdack@ua.ac.be
http://www.emas-web.net/
20th
– 25th June
2010, Lucca, Italy
Gordon Research Conference- 3-D Electron Microscopy
2010
The GRC on 3-D electron microscopy has recently doubled it’s meeting frequency from being held every two years in the US to an annual event alternating between the US and Europe. This development clearly demonstrates the strong interest in 3DEM methods and applications for biological specimens, and that the conference serves a growing community. In particular, since the rediscovery of (cryo-)electron tomography for large cellular structures the demand for 3DEM has literally exploded despite a current limitation in resolution to approx. 2 nm due to technical limitations. On the other end, recent work has shown that electron microscopy data of biological structures may reach atomic resolution beyond 0.2 nm. In-between these two extremes hybrid methods, combining intermediate resolution EM 3D maps with X-ray, NMR or even in-silico data have been improved tremendously and generated a lot of excitement for thorough investigations into protein structure and function relationships. Obviously these developments are as usual accompanied and made possible by new products from the relevant industries ranging for microscope technology (LHe-lenses, corrector lenses, energy filtering, phase-plates improved stages) to detector design (lens-coupled CCD systems, CMOS detectors etc.). At the same time data acquisition and image analysis software products are constantly improved and refined, playing their crucial role on the data handling and interpretation front.
The GRC conference on 3DEM has always been one of the most exciting meetings in the field and it brought together the leaders in electron microscopy with the next generation microscopists as well as industrial partners. The format allows for ample discussion and exchange between the official presentations, which is an extremely successful concept that has nothing lost of its attraction. As on previous conferences the programme will include formal presentations, poster presentations and workshops. Due to limited attendance (max. 150 participants) early registration is recommended.
Further
information from:
Dept.
of Mol. Cell. Dev. Biology
attn.
Dr. Andreas Hoenger
US-80309-0347
tel
http
29th
June – 01st July
2010, London, Great Britian
Microscience
2010
Further information from:
Royal
Microscopical Society
attn.
Ms. Clare Oxenbury
37/38
St. Clements
Oxford
OX4 1AJ, Great Britain
tel:
+44-1865-25.47.60, fax:
+44-1865-79.12.37, e-mail:
clare@rms.org.uk
http://www.rms.org.uk/microscience.shtml
July
2010, Brisbane, Australia
ACMM-21
21st Australian
Conference on Microscopy and Microanalysis
Further
information from:
http://www.microscopy.org.au/ACMM21/
03rd
– 07th August
2010, Portland, Oregon, USA
Microscopy
&
Microanalysis 2010
Joint
meeting of the Microscopy Society of
America
(MSA) and the MicroBeam Analysis Society (MAS), and the International
Metallographic Society (IMS)
Further
information from:
Hachero
Hill, Inc.
attn.
Ms. Nicole Guy
11260 Roger Bacon
Drive, suite 402
US-20190 Reston, Virginia,
U.S.A.
tel:
+1-703.964.12.40 ext. 14,
e-mail:
nicoleguy@mindspring.com
http://www.msa.microscopy.com/
19th
– 24th September
2010, Rio de Janero, Brazil
IMC17
17th
International Microscopy Congress
Bringing together,
through all forms of microscopy, the frontiers of nanotechnologies and
applications, medicine and life sciences, energy conversion,
environmental
protection and much more …
The International Microscopy Congress (IMC) held every four years under the auspices of International Federation of Societies for Microscopy (IFSM) has been providing an international forum for the state of the art of microscopy at the frontiers of research and applications in Materials Sciences and in Life Sciences. The Brazilian Society for Microscopy and Microanalysis (SBMM) is proud and happy to host the IMC 17. Brazil covers the majority of the South American Continent and Rio de Janeiro is an exuberant and cosmopolitan city with very pleasant weather in September. Easy access from all over the world, allows participation of delegates from all the IFSM affiliates societies to come to friendly Rio and feel at home.
Further information from:
http://www.imc17.com/
2011
15th
– 19th May
2011, Angers, France
EMAS 2011
12th European Workshop on Modern Developments and Applications in
Microbeam Analysis
Further
information from:
EMAS
Secretariat
c/o University of
Antwerp
Department of
Chemistry, Research Group PLASMANT
Attn. Mr. Luc Van't
dack
Campus Drie Eiken,
Universitatsplein 1
BE-2610
Antwerp-Wilrijk, Belgium.
tel:
+32-3-265.23.43,
fax:
+32-3-265.23.43,
e-mail: Luc.Vantdack@ua.ac.be
http://www.emas-web.net/
22nd
– 27th May
2011, Inchon, South Korea
IUMAS-V
5th
Meeting of
the International Union of Microbeam Analysis Societies
Further
information from:
Samsung
Advanced Institute of Technology
Analytical
Engineering Center
attn. Dr. Se Ahn
Song
P.O. Box 111
KR-440-600 Suwon,
South Korea
e-mail: sasong@samsung.com
Updated 20th June 2009