Forthcoming Meetings and Courses
2008
23rd
– 26th June
2008, London, Great Britain
Microscience 2008
Royal Microscopical Society International Conference
The MICROSCIENCE
International Conference continues
to grow and, in 2008, it will boast three parallel sessions covering
three
inspiring themes. These are:
· Characterisation
and nanofabrication of advanced materials
· The
cell in time and space
· Microscopy
and analysis at the frontiers
Each day kicks-off with a high-profile plenary lecture, providing an interesting and provocative start. These are followed by sessions composed of headline invited speakers - drawn from around the world - and submitted papers.
What makes MICROSCIENCE 2008 special is that the conference theatres and exhibition are housed within a single hall. Delegates can move with ease from lectures to demonstrations and discussions with company representatives. Or, they can network in the VIP lounge, the seating areas, or in the cafes that are also housed within the hall. If you haven't been to MICROSCIENCE before, make 2008 your first.
And, if stunning science and the world's largest dedicated exhibition aren't enough, MICROSCIENCE 2008 has a great social programme. In addition to the opening night reception, there is an exclusive river cruise on Tuesday evening, and a Party on the Plaza on Wednesday night.Further
information from:
Royal
Microscopical Society
attn.
Ms. Clare Oxenbury
37/38
St. Clements
Oxford
OX4 1AJ, Great Britain
tel:
+44-1865-25.47.60, fax: +44-1865-79.12.37, e-mail: clare@rms.org.uk
http://www.microscience2008.org.uk/ms08/show_link1.asp
09th
– 11th July
2008, Berlin, Germany
Seeing at the Nanoscale VI
6th Annual Scientific Conference focusing on Nanostructural Imaging, Characterization, and Modification using Scanning Probe Microscopy (SPM) and Related TechniquesFurther
information from:
http://www.screen-sar;.com/screenmails/veeco/editeur/userimages/n_2/SEEINGVI/SeeingattheNanoscaleVI.pdf
Microscopy
&
Microanalysis 2008
Joint meeting of the
Microscopy Society of America (MSA), the
Microbeam
Analysis Society (MAS), and the International Metallographic Society
(IMS)
Further
information from:
Hachero
Hill, Inc.
attn.
Ms. Nicole Guy
11260 Roger Bacon
Drive, suite 402
US-20190 Reston, Virginia, U.S.A.
tel:
+1-703.964.12.40 ext. 14,
e-mail: nicoleguy@mindspring.com
http://www.msa.microscopy.com/
01st
– 05th September
2008, Aachen, Germany
EMC2008
14th European Microscopy Congress
May we cordially invite you to participate in the 14th European Microscopy Congress which will be held at Aachen from September 1–5, 2008. Jointly organised by the European Microscopy Society (EMS), the German Society for Electron Microscopy (DGE) and the local microscopists from RWTH Aachen University and the Research Centre Jülich, the congress will bring together scientists from Europe and from all over the world. The venue of the meeting will be the Eurocongress Centre at Aachen, a world class congress centre which is just a short walk away from the beautiful historic city centre of Aachen.
The scientific programme committee has put together an exciting programme which covers all recent developments in the three major areas of instrumentation and methods, materials science and life science. Plenary and invited lectures will give overviews on exciting new developments and state-of-the art research in the field and will be delivered by the world leading experts. However, the success of a scientific meeting vitally depends on the number and the quality of the contributed papers and we sincerely hope that you will support this with your contributions. Special emphasis will be placed on the importance of the poster sessions and hence considerable time will be reserved for the presentation and discussion of the posters.
As in the past, EMC 2008 will host a major trade exhibition, which will bring together manufacturers of all different kinds of microscopy techniques, as well as suppliers of accessories and consumables, preparation tools, image analysis systems, and all important publishers in the field. The manufacturers will introduce their latest developments and highlight new potential applications in technical lectures which will address a general audience. In the Eurocongress Centre, the commercial exhibition will form an integral part of the Congress and will contribute to the fact that EMC 2008 will be an all-embracing source of information for anybody who is interested in microscopy.
However, Aachen is more than just a very nice venue for a conference: located close to the borders of Belgium and the Netherlands, Aachen unites tradition with progress. Charlemagne has left his mark throughout the city. The cathedral - the first monument in Germany to be included in the UNESCO Cultural Heritage list - and the gothic City Hall in which 32 German kings celebrated their coronations still form the heart of Aachen’s old city centre. Aachen is an attractive city with a distinct flair and atmosphere of its own. The unique layout of the old city centre, the important historic monuments, the wells and baths over the hottest natural springs in Europe, the bustling activity in the streets and squares, the cultural diversity and quality as well as the many recreational and leisure activities make Aachen an exciting and rewarding place to stay. We would like to treat you like a king - not only at the Congress Banquet which will be held in the Coronation Hall of our gothic City Hall.
We are looking forward to welcoming you in Aachen and to sharing with you an exciting congress and a memorable week in one of the most beautiful towns in Germany.Further
information from:
RWTH
Aachen
Gemeinschaftslabor
für Elektronenmikroskopie
(GfE)
attn.
Prof. Dr. Joachim Mayer
Ahornstrasse
55
DE-52074
Aachen, Germany
tel:
+49-2412-802.43.45, fax:
+49-241-802.23.13, e-mail: gfe@gfe.rwth-aachen.de
http://www.eurmicsoc.org/emc2008.html
07th
– 11th September
2008, Trieste, Italy
LEEM - PEEM 6
6th International Workshop on LEEM - PEEM
Further
information from:
Sincrotrone
Trieste S.C.p.A
attn. Andrea
Locatelli
Area Science Park
IT-34012
Basovizza-Trieste, Italy
tel:
+39-040-375.87.03,
fax: +39-040-37.58.77, e-mail:
andrea.locatelli@elettra.trieste.it
http://www.elettra.trieste.it/leempeem6
08th
– 10th September
2008, Soest, Germany
AOFA 15 - 15
Arbeitsagung Angewandte Oberflächenanalytik
Further
information from:
Technologie-
und Wissenstransfer im Kreis Soest
eV
attn.
Dr. H. Paulus
Lübecker
Ring 2
DE-59494
Soest, Germany
tel:
+49-2921-37.84.21,
fax: +49-2921-37.84.29, e-mail:
h.paulus@fh-swf.de
14th
– 16th September
2008, Münster, Germany
SIMS Europe 2008
The 6th European SIMS workshop will offer you an
extensive
SIMS update. We
are expecting again about 250 participants.
The organization of the program will follow the scope of the previous workshops. We will start again on Sunday with a Short Course. It will address fundamentals of SIMS in the morning. In the afternoon, state-of-the-art SIMS surface mass spectrometry, imaging, and depth profiling will be presented.
Emphasis will be on the analytical applications of SIMS, in well-established fields such as microelectronics and material sciences, as well as in emerging fields like life sciences and nano-technologies. Recognized invited speakers will present keynote lectures, followed by contributed papers and poster sessions.
Cluster ion bombardment will remain a most important topic. Since our last European SIMS Workshop in Münster 2006, the development has been fast and impressive - in instrumentation, analytical applications and in the development of models. Cluster ion beams are now used by the majority of SIMS laboratories worldwide, and a large number of experimental results - for a wide variety of samples as well as a wide variety of cluster ions - have been accumulated. SIMS Europe 2008 is an appropriate and timely opportunity for a critical review and assessment of these developments. We intend to do this in a dedicated workshop.
Further
information from:
University of Münster
Physikalisches
Institut
Wilhelm-Klemm-Str.
10
DE-48149
Münster, Germany
tel:
+49-251-8333611, e-mail: bennial@uni-muenster.de
http://www.sims-europe.uni-muenster.de
02nd
– 07th November
2008, Jeju Island, South Korea
9th Asia-Pacific Microscopy Conference
Further
information from:
e-mail
: huchul@snu.ac.kr
http://www.apmc9.or.kr
17th
– 20th November
2008, Ghent, Belgium
ICTF14
14th International Conference on
Thin Films
This conference is by far the most complete event
for
bringing together the scientific and technological community active in
the field
of coatings and thin films. It is one
of the tri-annual conference series endorsed and co-organised by the
Thin Film
Division of the International Union for Vacuum Science, Technique and
Applications “IUVSTA”. This
union
represent nearly 15000 physicists, chemists, material scientists,
engineers and
technologists from all over the world, all linked together through
their common
use of vacuum.
Newcomers as well as experienced researchers will have the
possibility to broaden their scope in the ever growing field of
coatings and thin
films. Without loosing the focus on
thin films as such, this 14th edition will also cover new aspects as
the
interaction biology-coatings and nanoscience-coatings.
Among the main topics of the sessions for
the Congress is also:
Characterization and Instrumentation
Further
information from:
Ghent
University
Department
of Solid State Sciences
ICTF14
Krijgslaan
281/S1
BE-9000
Gent, Belgium
e-mail :
ictf14@Ugent.be
http://www.ictf14.ugent.be/
2009
10th
– 14th May
2009, Gdansk, Poland
EMAS 2009
11th European Workshop on Modern Developments and Applications in
Microbeam Analysis
Further
information from:
EMAS
Secretariat
c/o University of
Antwerp
Department of
Chemistry, MiTAC
Attn. Mr. Luc Van't
dack
Campus Drie Eiken,
Universitatsplein 1
BE-2610
Antwerp-Wilrijk, Belgium.
tel:
+32-3-820.23.43,
fax:
+32-3-820.23.43,
e-mail: Luc.Vantdack@ua.ac.be
http://www.emas-web.net/
26th
–30th July
2009, Richmond, Virginia, USA
Microscopy
&
Microanalysis 2009
Joint
meeting of the Microscopy Society of
America
(MSA) and the MicroBeam Analysis Society (MAS), and the International
Metallographic Society (IMS)
Further
information from:
Hachero
Hill, Inc.
attn.
Ms. Nicole Guy
11260 Roger Bacon
Drive, suite 402
US-20190 Reston, Virginia, U.S.A.
tel:
+1-703.964.12.40 ext. 14,
e-mail: nicoleguy@mindspring.com
http://www.msa.microscopy.com/
30th
August – 04th September
2009, Graz, Austria
Microscopy
Conference 2009
Joint
meeting of the 9th Multinational Congress on Microscopy and the
Dreiländertagung 2009
The Microscopy Conference 2009 in Graz is joining up the “Multinational Congress on Microscopy” and the “Dreiländertagung” both having established a strong reputation as key events in the European and international microscopy communities. MC 2009 will continue this successful tradition in Graz, a city in the centre of Europe that has a long history in science, engineering and culture.
The scientific programme of MC 2009 will comprise plenary lectures, symposia, poster presentations, and tutorials. A high quality Trade Exhibition will be a main part of MC 2009 with a mixture of exhibits and technical workshops to enable delegates to interact with vendors and witness the latest developments in microscopy in the physical and life sciences, and nanotechnology.
It is our aim to
encourage the participation of young scientists; therefore several
fellowships will be offered and
the conference fee for students will be below € 100,–.
There will be poster prize awards in different scientific fields.
Further
information from:
Ferdinand
Hofer
Graz University
of Technology
Steyrergasse 17,
A-8010 Graz,
Austria
tel:
+43 316 873 83 20, fax: +43 316 81 15 96,
e-mail: sekretariat@felmi-zfe.at
http://www.microscopy09.tugraz.at/
14th
– 18th September
2009, Karlsruhe, Germany
ICXOM20
20th International
Congress on X-ray Optics and Microanalysis
This is the second time a congress of this series is held in Germany, the last time being in 1968 in Tübingen. ICXOM20 is dedicated to providing a platform for discussion and information exchange for users and experts from the field of micro (nano) analysis by means of X-ray beams (with an emphasis in 2009 on synchrotron sources), electrons or other energetic particles. The ICXOM20 target audience is both persons already involved in these fields, as well as newcomers. Presentations of new scientific results from scientists involved in fundamental and applied research from these fields or active in methodological and instrumental developments will be made by invited and contributing speakers, demonstrating recent progress. ICXOM20 provides attendees an excellent opportunity to establish or renew contacts with colleagues during the scientific programme, the poster session, the excursion programme, or at the industrial exhibitions. Topics to be dealt with are:
Satellite seminar: "Introduction to synchrotron-based micro & nano analysis and imaging techniques"
The ICXOM20 programme includes one seminar day on synchrotron-based micro/nanoanalysis and imaging methods for students and beginners in, on Monday, September 14, 2009 before the official ICXOM20 programme begins. Participation is limited to 25 persons and is on a first come, first serve basis. The following lecture topics will be covered:
Further
information from:
Forschungszentrum
Karlsruhe GmbH
Institut
für Nukleare Entsorgung
attn.
Dr. Melissa A. Denecke
P.O. Box 3060
DE-76021
Karlsruhe, Germany
tel:
+49-7247-82.55.36, e-mail: ICXOM20@ine.fzk.de
http://icxom20.fzk.de
2010
03rd
– 07th August
2010, Portland, Oregon, Virginia, USA
Microscopy
&
Microanalysis 2010
Joint
meeting of the Microscopy Society of
America
(MSA) and the MicroBeam Analysis Society (MAS), and the International
Metallographic Society (IMS)
Further
information from:
Hachero
Hill, Inc.
attn.
Ms. Nicole Guy
11260 Roger Bacon
Drive, suite 402
US-20190 Reston, Virginia, U.S.A.
tel:
+1-703.964.12.40 ext. 14,
e-mail: nicoleguy@mindspring.com
http://www.msa.microscopy.com/
Updated 22
June 2008