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EMAS 2011
12th EMAS European Workshop on
Modern Developments and Applications in Microbeam Analysis

15th – 19th May 2011
Centre de Congrès d’Angers, Angers, France

The speakers from the recent European Workshop have kindly agreed to allow us to post their presentations on the EMAS web pages.  For some of the presentations we are only able to offer either the abstract or the presentation, but for many you have both the full presentation and the full Book of Tutorials and Abstracts paper.  We're hoping to offer this facility for all future EMAS workshops, but be aware that this material will only be available for a limited period after each workshop so don't delay ....

High-resolution X-ray spectrometry, Philippe JONNARD (Université Pierre et Marie Curie, Laboratoire de Chimie Physique Matière et Rayonnement, Paris, France)  ppt,  doc

Trace analysis in EPMA, Michael J. JERCINOVIC (University of Massachusetts, Electron Microprobe and Scanning Electron Microscope Facility, Amherst, MA, U.S.A.)  ppt,  doc

Uncertainty and capability of quantitative EPMA at low voltage, Claude MERLET (Université Montpellier II Sciences et Techniques du Languedoc, Laboratoire Géosciences Montpellier, Montpellier, France)  ppt,  doc

X-ray microanalysis: the state-of-the-art of SDD detectors and WDS systems on scanning electron microscopes (SEM), Laurent MANIGUET (Institut Polytechnique de Grenoble, Consortium des Moyens Technologiques Communs, Saint Martin d'Hères, France)  ppt,  doc

Multivariate statistical analysis of hyperspectral microanalysis datasets, John Henry J. SCOTT (National Institute of Standards and Technology, Surface & Microanalysis Science Division, Gaithersburg, MD, U.S.A.)  ppt,  doc

Mineral surface - organic matter interactions and applications, Giovanni VALDRE (Università di Bologna, Dipartimento di Scienze della Terra e Geologico-Ambientali, Bologna, Italy)  ppt,  doc

Application of microbeam analysis to photovoltaics, Verónica BERMUDEZ (Nexcis, Rousset, France)  ppt,  doc

Electron probe microbeam analysis of volcanic ash, Stuart L. KEARNS (University of Bristol, Department of Earth Sciences, Bristol, Great Britain)  ppt,  doc

Applications of microbeam analysis to nuclear materials, Clive T. WALKER (European Commission, JRC, Institute for Transuranium Elements, Karlsruhe, Germany)  ppt,  doc

Nuclear reaction analysis (NRA) at the micrometre scale, Hicham KHODJA (C.E.A. Saclay, IRAMIS - Laboratoire d'Etude des Eléments Légers, Gif-sur-Yvette, France)  ppt,  doc

LIBS for microanalysis - tool or toy?, Ulrich PANNE (Bundesanstalt für Materialforschung - und prüfung (BAM), Dept. Analytische Chemie; Referenzmaterialien, Berlin, Germany)  ppt,  doc

Multiscale Raman microanalysis of ill-organized solids, at the laboratory or with portable instruments, Philippe COLOMBAN (C.N.R.S. - Université Pierre-et-Marie-Curie / Paris 6, Laboratoire de Dynamique, Interaction et Réactivité, Paris, France)  ppt,  doc

Texture and phase analysis at the nanoscale: new application of electron diffraction in the TEM, Edgar F. RAUCH (Institut Polytechnique de Grenoble, Laboratoire Science et Ingénierie des Matériaux et Procédés - SIMaP, Saint Martin d'Hères Cedex, France)  ppt,  doc

Quantitative microstructural analysis by orientation contrast microscopy, Leo A.I. KESTENS (Ghent University, Materials Science and Engineering Department, Ghent, Belgium)  ppt,  doc

Contrast mechanisms of low-loss backscattered electrons in a field emission SEM, Heiner JAKSCH (Carl Zeiss SMT AG, Nano Technology Systems Division, Oberkochen, Germany)  ppt,  doc

Microanalysis in a FIB/SEM: EDX in 3D.  What can we expect, where are the limits ...?, Marco CANTONI (Ecole Polytechnique Fédérale de Lausanne, Centre Interdépartementale Microscopie Electronique (CIME), Lausanne, Switzerland)  ppt,  doc

X-ray microanalysis in low-vacuum SEM, Robert A. CARLTON (GlaxoSmithKline Pharmaceuticals, Department of Physical Properties, King of Prussia, PA, U.S.A.)  ppt,  doc


Last updated: 21 Oct 2011

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