EMAS 2011
12th EMAS European Workshop on
15th – 19th May 2011
Centre de Congrès d’Angers,
Angers, France
The speakers
from the recent
European Workshop have kindly agreed to allow us to post their
presentations on
the EMAS web pages. For some of the
presentations we are only able to offer either the abstract or the
presentation, but for many you have both the full presentation and the
full Book
of Tutorials and Abstracts paper. We're
hoping to offer this facility for all
future EMAS workshops, but be aware that this material will only be
available
for a limited period after each workshop so don't delay
....
High-resolution
X-ray spectrometry, Philippe
JONNARD (Université Pierre et
Marie Curie, Laboratoire
de Chimie Physique Matière
et Rayonnement, Paris, France) ppt,
doc
Trace
analysis in EPMA, Michael
J. JERCINOVIC (University of Massachusetts, Electron Microprobe and
Scanning Electron Microscope Facility, Amherst, MA, U.S.A.) ppt,
doc
Uncertainty
and capability of quantitative EPMA at low
voltage, Claude
MERLET (Université
Montpellier II Sciences et Techniques du
Languedoc, Laboratoire Géosciences
Montpellier, Montpellier, France) ppt, doc
X-ray
microanalysis
Multivariate
statistical analysis of hyperspectral microanalysis datasets, John Henry J. SCOTT (National
Institute
of Standards and Technology, Surface & Microanalysis Science
Division,
Gaithersburg, MD, U.S.A.)
ppt,
doc
Mineral
surface - organic matter interactions and
applications, Giovanni
VALDRE (Università di Bologna, Dipartimento
di Scienze della Terra e Geologico-Ambientali,
Bologna, Italy)
ppt, doc
Application
of microbeam analysis to photovoltaics,
Verónica BERMUDEZ (Nexcis, Rousset, France)
ppt,
doc
Electron
probe microbeam analysis of volcanic ash, Stuart
L. KEARNS (University of Bristol, Department of Earth Sciences,
Bristol, Great Britain)
ppt, doc
Applications
of microbeam analysis to nuclear
materials, Clive T.
WALKER
(European Commission, JRC, Institute for Transuranium Elements,
Karlsruhe,
Germany) ppt,
doc
Nuclear
reaction analysis (NRA) at the micrometre
scale, Hicham
KHODJA
(C.E.A. Saclay, IRAMIS - Laboratoire
d'Etude des Eléments
Légers, Gif-sur-Yvette,
France) ppt,
doc
LIBS for
microanalysis - tool or toy?, Ulrich
PANNE (Bundesanstalt für Materialforschung
- und prüfung
(BAM), Dept. Analytische Chemie;
Referenzmaterialien, Berlin, Germany) ppt, doc
Multiscale
Raman microanalysis of ill-organized solids, at the laboratory or with
portable
instruments, Philippe
COLOMBAN
(C.N.R.S. - Université
Pierre-et-Marie-Curie / Paris
6, Laboratoire de Dynamique,
Interaction et Réactivité,
Paris, France) ppt,
doc
Texture
and phase analysis at the nanoscale
Quantitative
microstructural analysis by orientation
contrast microscopy, Leo A.I.
KESTENS
(Ghent University, Materials Science and Engineering Department, Ghent,
Belgium) ppt,
doc
Contrast
mechanisms of low-loss backscattered
electrons in a field emission SEM,
Heiner
JAKSCH
(Carl Zeiss SMT AG, Nano Technology
Systems Division,
Oberkochen, Germany) ppt,
doc
Microanalysis
in a FIB/SEM
X-ray
microanalysis in low-vacuum SEM, Robert
A. CARLTON (GlaxoSmithKline Pharmaceuticals, Department of
Physical Properties, King of Prussia, PA, U.S.A.) ppt,
doc
Last
updated: 21 Oct 2011