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10th
– 14th May 2009
Hotel Faltom Spa, Gdynia/Rumia, Gdansk, Poland
The speakers from the recent
European
Workshop have kindly agreed to allow us to post their presentations on
the EMAS
web pages.
For some of the presentations
we are only able to offer either the abstract or the presentation, but
for many
you have both the full presentation and the full Book of
Tutorials and Abstracts paper. We're
hoping to offer this facility for all
future EMAS workshops, but be aware that this material will only be
available
for a limited period after each workshop so don't delay ....
75
years of Kossel
patterns,
Enrico
Langer, Dresden University of
Technology, Institute for Solid State
Physics, Dresden, Germany ppt,
doc
State of the
art in EBSD technology,
Karsten Kunze,
Swiss Federal Institute of Technology, Electron
Microscopy Centre, Zürich, Switzerland ppt
Overview of new
tools to evaluate large
EDS datasets, Hans
Dijkstra, Thermo Fisher
Scientific BV,
Breda, The
Netherlands ppt
Applications of
fast high-resolution EDS
processing, Edward
D. Boyes, University of York,
Department
of
Physics & Electronics, York Jeol Nanocentre, York, Great Britain doc
Using DTSA-II
to simulate and interpret
energy-dispersive spectra from particles,
Nicholas W.M. Ritchie,
National Institute of Standards and Technology, Surface &
Microanalysis
Science Division, Gaithersburg, MD, U.S.A. ppt,
doc
Microbeam
analysis in Poland - past and
future, Jan
Kusinski, AGH University of
Science &
Technology,
Department of Metallurgy & Materials Science, Krakow, Poland ppt,
doc
EPMA: why we still need it,
Jürgen Börder,
Jeol (Germany) GmbH, Eching, Germany ppt
SAED-based
orientation and texture
determination as part of phase analysis in the TEM,
János
Lábár,
Hungarian Academy of Sciences, Research Institute for Technical Physics
&
Materials Science, Budapest, Hungary ppt
Uncertainties
in quantitative electron
probe microanalysis, Ryna
B. Marinenko, National Institute
of
Standards and Technology, Surface & Microanalysis Science
Division,
Gaithersburg, MD, U.S.A. ppt,
doc
3D
nano-characterisation of materials by
FIB-SEI/EDS tomography, Fernando
A. Lasagni1
&
Andrés F.
Lasagni2,
1
FADA - Andalusian Foundation for
Aerospace Development, CATEC - Center for Advanced Aerospace
Technologies, La
Rinconada, Sevilla, Spain & 2
Fraunhofer IWS, Surface
Functionalisation, Dresden, Germany ppt,
doc
3-dimensional
orientation microscopy
using FIB-EBSD tomography: an overview on techniques,
applications, and
limits,
Stephan Zaefferer,
Max Planck Institute
for Iron Research, Diffraction & Microscopy Group,
Düsseldorf,
Germany ppt,
doc
Nanoscale
analysis in 3D using electron
tomography, Paul
Midgley, University of
Cambridge,
Department of
Materials Science & Metallurgy, Cambridge, Great Britain ppt,
doc
The role of
atom-probe tomography in
materials science, Didier
Blavette, University of Rouen,
Materials
Physics Group, Saint Etienne du Rouvray, France ppt, doc
Petrology -
microbeam analysis of core
samples from drilled exploration wells and outcrops,
Johannes
M. Rykkje, International Research Institute of
Stavanger (IRIS), Stavanger, Norway ppt,
doc
Automated
mineralogy, Herman
Lemmens, FEI Company, Eindhoven,
The Netherlands
ppt,
doc
Microanalysis
in the metals recycling
industry, Eddy
Boydens, Umicore Research,
Analytical
Competence
Centre, Olen, Belgium
ppt,
doc
Application of X-ray microanalytical methods to mining related
environmental
problems, János
Osan, Hungarian Academy of
Sciences,
Atomic Energy
Research Institute, Health & Environmental Physics Department,
Budapest,
Hungary ppt,
doc
Last updated: 13
October 2009
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