Back to Homepage


EMAS 2009
11th EMAS European Workshop on
Modern Developments and Applications in Microbeam Analysis

10th – 14th May 2009
Hotel Faltom Spa, Gdynia/Rumia, Gdansk, Poland

The speakers from the recent European Workshop have kindly agreed to allow us to post their presentations on the EMAS web pages.  For some of the presentations we are only able to offer either the abstract or the presentation, but for many you have both the full presentation and the full Book of Tutorials and Abstracts paper.  We're hoping to offer this facility for all future EMAS workshops, but be aware that this material will only be available for a limited period after each workshop so don't delay ....

75 years of Kossel patterns, Enrico Langer, Dresden University of Technology, Institute for Solid State Physics, Dresden, Germany  ppt, doc

State of the art in EBSD technology, Karsten Kunze, Swiss Federal Institute of Technology, Electron Microscopy Centre, Zürich, Switzerland  ppt

Overview of new tools to evaluate large EDS datasets, Hans Dijkstra, Thermo Fisher Scientific BV, Breda, The Netherlands  ppt

Applications of fast high-resolution EDS processing, Edward D. Boyes, University of York, Department of Physics & Electronics, York Jeol Nanocentre, York, Great Britain  doc

Using DTSA-II to simulate and interpret energy-dispersive spectra from particles, Nicholas W.M. Ritchie, National Institute of Standards and Technology, Surface & Microanalysis Science Division, Gaithersburg, MD, U.S.A.  ppt, doc

Microbeam analysis in Poland - past and future, Jan Kusinski, AGH University of Science & Technology, Department of Metallurgy & Materials Science, Krakow, Poland  ppt, doc

EPMA
: why we still need it, Jürgen Börder, Jeol (Germany) GmbH, Eching, Germany  ppt

SAED-based orientation and texture determination as part of phase analysis in the TEM, János Lábár, Hungarian Academy of Sciences, Research Institute for Technical Physics & Materials Science, Budapest, Hungary  ppt

Uncertainties in quantitative electron probe microanalysis, Ryna B. Marinenko, National Institute of Standards and Technology, Surface & Microanalysis Science Division, Gaithersburg, MD, U.S.A.  ppt, doc

3D nano-characterisation of materials by FIB-SEI/EDS tomography, Fernando A. Lasagni1 & Andrés F. Lasagni2, 1 FADA - Andalusian Foundation for Aerospace Development, CATEC - Center for Advanced Aerospace Technologies, La Rinconada, Sevilla, Spain & 2 Fraunhofer IWS, Surface Functionalisation, Dresden, Germany  ppt, doc

3-dimensional orientation microscopy using FIB-EBSD tomography
: an overview on techniques, applications, and limits, Stephan Zaefferer, Max Planck Institute for Iron Research, Diffraction & Microscopy Group, Düsseldorf, Germany  ppt, doc

Nanoscale analysis in 3D using electron tomography, Paul Midgley, University of Cambridge, Department of Materials Science & Metallurgy, Cambridge, Great Britain  ppt, doc

The role of atom-probe tomography in materials science, Didier Blavette, University of Rouen, Materials Physics Group, Saint Etienne du Rouvray, France  ppt, doc

Petrology - microbeam analysis of core samples from drilled exploration wells and outcrops, Johannes M. Rykkje, International Research Institute of Stavanger (IRIS), Stavanger, Norway  ppt, doc

Automated mineralogy, Herman Lemmens, FEI Company, Eindhoven, The Netherlands  ppt, doc

Microanalysis in the metals recycling industry, Eddy Boydens, Umicore Research, Analytical Competence Centre, Olen, Belgium  ppt, doc

Application of X-ray microanalytical methods to mining related environmental problems
, János Osan, Hungarian Academy of Sciences, Atomic Energy Research Institute, Health & Environmental Physics Department, Budapest, Hungary  ppt, doc


Last updated: 13 October 2009

Back to Homepage