EMAS 2010
9th Regional Workshop on "Electron Probe Microanalysis Today - Practical Aapects
25 - 28 April
2010
Amsterdam, The Netherlands
Book of Tutorials & Abstracts
Edited by: I. Joosten
Table
of Contents
- Table
of contents
3
- Foreword
5
- European
Microbeam
Analysis Society
Sustaining
Companies
9
- EMAS
2010
International Scientific and Local Organising Committees
11
- Workshop
programme
13
- Principles
of electron probe microanalysis
17
Introduction
to
EPMA and SEM. 19
Light
element
analysis.
29
PXRF,
µ-XRF,
vacuum µ-XRF and EPMA analysis of ‘Email
Champlevé’ objects present in Belgian
museums. 39
V. Van der Linden, E. Meesdom, A. Devos, R. Van Dooren, H. Nieuwdorp, E. Janssen, S. Balace, B. Vekemans, L. Vincze and Koen Janssens
Quantification
in electron probe microanalysis.
59
Performance
characteristics of WDS and EDS detectors.
75
Sample
preparation
for EPMA.
107
Electron
backscatter diffraction
Patricia Romano
Triguero
- Microbeam
analysis on cultural heritage
149
Analysis
of
paintings by multispectral IR reflectography.
151
Claudia Daffara
Identification
of
early synthetic organic dyestuffs using µ-Raman
spectroscopy.
165
Suzan de Groot,
L.O.E.S. Vermeij and M.R. van Bommel
Looking through van Gogh
Joris Dik
Quantitative
determination of van Gogh’s painting grounds using SEM/EDS.
171
Ralph Haswell, L. Carlyle and K.T.J. Mensch
Study
of surfaces
by low-voltage and variable pressure SEM.
183
Ineke Joosten
Non-destructive
identification of art objects using multispectral mapping images and
acoustic
microscopy.
191
Georgios Karagiannis
How
to study a
pigment that has disappeared?
193
Katrien Keune
Colourful
surfaces.
209
Luc Megens
In
situ analysis
of object surfaces by portable X-ray diffraction and fluorescence.
211
François Mirambet and J. Castaing
Analysis
of
ancient and historic glass and ceramic glazes by laser ablation
inductively
coupled mass spectrometry.
225
Norman H. Tennent, J.T. van Elteren and V.S. Šelih
PARC
- Phase analysis, recognition and characterization
Corrie J.G. van
Hoek, M. de Roo, G. Van der Veer and S.R. van der Laan
- Abstracts
of the poster presentations
249