PROCEEDINGS OF THE EMAS 2009 EUROPEAN WORKSHOP

IOP Conf. Ser.; Mater. Sci. Eng. (2010) 7 [doi: 10.1088/1757-899X/7/]

Edited by: J. L. Lábár, C. T. Walker, M. Zelechower and P. Zieba

    This volume of IOP Conference Series: Materials Science and Engineering contains papers from the 11th Workshop of the European Microbeam analysis Society (EMAS) on Modern Developments and Applications in Microbeam Analysis which took place from 10‑14 May 2009 in the Hotel Faltom, Gdynia, Poland.

    The primary aim of this series of workshops is to assess the state-of-the-art and reliability of microbeam analysis techniques.  The workshops also provide a forum where students and young scientists starting out on careers in microbeam analysis can meet and discuss with the established experts.  The workshops have a very distinct format comprising invited plenary lectures by internationally recognized experts, poster presentations by the participants and round table discussions on the key topics led by specialists in the field.  For this workshop EMAS invited speakers on the following topics: EPMA, EBSD, fast energy‑dispersive X-ray spectroscopy, three-dimensional microanalysis, and micro-and nanoanalysis in the natural resources industry.

    The continuing relevance of the EMAS workshops and the high regard in which they are held internationally can be seen from the fact that 69 posters from 16 countries were on display at the meeting and that the participants came from as far away as Japan and the USA.  A number of participants with posters were invited to give short oral presentations of their work in two dedicated sessions.  As at previous workshops there was also a special oral session for young scientists.  Small cash prizes were awarded for the three best posters and for the best oral presentation by a young scientist.  The prize for the best poster went to the contribution by G Tylko, S Dubchak, Z Banach and K Turnau, entitled: Monte Carlo simulation for an assessment of standard validity and quantitative X-ray microanalysis in plant.  Joanna Wojewoda-Budka of the Institute of Metallurgy and Materials Science, Krakow, received the prize for the best oral presentation by a young scientist for her talk entitled: Application of focussed ion beam technique for TEM multilayer materials examination.

    This volume contains the full texts of 5 of the invited plenary lectures and of 24 papers on related topics originating from the posters presented at the workshop.  All the papers have been subjected to peer review by a least two referees.

January 2009

Acknowledgements

          On behalf of the European Microbeam Analysis Society I would like to thank all the invited speakers, session chairs and members of the discussion panels for making the meeting such a great success.  Special thanks go to Michal Zelechower and Luc Van't dack who directed the organisation of the workshop giving freely of their time and talents.  As was the case for previous workshops, the EMAS board in corpore was responsible for the scientific programme.  I am particular grateful to the exhibiting companies and sustaining members for their generous support of the workshop.  In this context I would like particularly to mention:

·    Silesian University of Technology, Gliwice

·    Gdansk University of Technology

·    Polish Society for Microscopy (PTMi), Krakow

·    Polish Academy of Sciences – Materials Science Committee, Warsaw

·    Polish Academy of Sciences – Institute of Metallurgy and Materials Science, Krakow

·    Polish Academy of Sciences – Institute of Physics, Warsaw

·    AGH University of Science and Technology, Krakow

·    Warsaw University of Technology

Below is a combined list of the exhibiting companies and sponsors of the workshop:

·    Ametek GmbH (Germany)

·    Blackwell Publishing Ltd. (UK)

·    Bruker AXS Microanalysis GmbH (Germany)

·    Cameca SA (France)

·    Carl Zeiss SMT GmbH (Germany)

·    COMEF Aparatura Naukowo-Badawcza (Poland)

·    EU-JRC: Inst. for Transuranium Elements (Germany)

·    FEI Company (The Netherlands)

·    IfG – Institute for Scientific Instruments GmbH (Germany)

·    Jeol (Europe) SAS (France)

·    John Wiley & Sons (UK)

·    Olympus Soft Imaging Solutions GmbH (Germany)

·    Oxford Instruments NanoAnalysis Ltd. (UK)

·    Probe Software, Inc. (USA)

·    Roenalytic GmbH (Germany)

·    Target-Messtechnik (Germany)

·    Thermo Fisher Scientific BV (The Netherlands)

Clive T Walker

EMAS President

Table of contents (manuscript no. in bold)

-  Investigation of hot cracking resistance of 2205 duplex steel

    J Adamiec and B Ścibisz    012001

-  Investigation of susceptibility to hot cracking of MSR-B magnesium alloy

    J Adamiec and S Mucha    012002

-  Orientation mapping applied to the study of ferroelectric ceramic

    K Berent, M Faryna and M Płońska    012003

-  The investigation of boron-doped silicon using atom probe tomography

    D Blavette, E Cadel, O Cojocaru-Mirédin and B Deconihout    012004

-  Application of EDS microanalysis in the identification of inhomogeneities in surface protective layers on ductile cast iron parts

    Ł Boroń and A Tchórz     012005

-  Investigation of high temperature irradiated fuel-liquefied Zircaloy interactions in support of severe accident safety studies

    D Bottomley, D Papaioannou, D Pellottiero, D Knoche and V V Rondinella    012006

-  Automated element identification for EDS spectra evaluation using quantification and integrated spectra simulation approaches

    F Eggert    012007

-  Numerical correction for secondary fluorescence across phase boundaries in EPMA

    J A Escuder, F Salvat, X Llovet and J J Donovan    012008

-  SEM-EDS, EPMA and MRS analysis of neo-crystallisations on weathered glasses

    R Falcone, M Nardone, A Sodo, G Sommariva, M Vallotto and M Verità     012009

-  A study of the appearance of Li Kα

    S Fukushima, T Ogiwara, T Kimura and S Tanuma    012010

-  Abandoned mine slags analysis by EPMA WDS X-ray mapping

    F Guimarães, L Rosado, C Morais, A E Candeias, A P Pinto and J Mirão    012011

-  Electron microscopy and microanalysis of steel weld joints after long time exposures at high temperatures

    D Jandová, J Kasl and A Rek     012012

-  The preparation of oriented samples of ferromagnetic shape memory alloy CoNiAl

    J Kopeček, K Jurek, M Jarošová, J Drahokoupil, S Sedláková-Ignácová, P Šittner and V Novák    012013

-  Microbeam X-ray analysis in Poland – past and future

    J Kusinski     012014

-  75 years of Kossel patterns – past and future

    E Langer and S Däbritz    012015

-  3D Nano-characterisation of materials by FIB-SEI/EDS tomography

    F A Lasagni, A F Lasagni, I Huertas-Olivares, C Holazapfel and F Mücklich    012016

-  Uncertainties in electron probe microanalysis

    R B Marinenko and S Leigh    012017

-  Characterisation of heavy metal-bearing phases in stream sediments of the Meža River Valley, Slovenia, by means of SEM/EDS analysis

    M Miler and M Gosar    012018

-  Microstructural characteristics and technological properties of YSZ-type powders designed for thermal spraying of TBC

    G Moskal    012019

-  Quantitative EDS analysis in transmission electron microscopy using unconventional reference materials

    M Nacucchi, M Alvisi, D Altamura, V Pfister, M Re, M A Signore and M Vittori Antisari    012020

-  Microstructural analysis of titanium aluminide formed in situ in an aluminium matrix composite

    A Olszówka-Myalska and W Maziarz    012021

-  Studies of the AZ91 magnesium alloy / SiO2-coated carbon fibres composite microstructure

    A Olszówka-Myalska and A Botor-Probierz    012022

-  The role of SIMS in the investigation of the complex crystal chemistry of mica minerals

    L P Ottolini, E Schingaro, F Scordari, E Mesto and M Lacalamita    012023

-  Application of orientation imaging to the study of substructural development in cold deformed Al-0.3%Mn single crystal of {110}<112> orientation

    H Paul, C Maurice, J H Driver and M Miszczyk    012024

-  Calibration of a Cameca SX100 microprobe for the measurement of retained xenon in nuclear fuels

    P Pöml, S Brémier, F Lahuerte, R Hasnoui and C T Walker    012025

-  An investigation of trace and isotope light elements in mineral phases from well RN-17 (Reykjanes Peninsula, SW Iceland)

    N Raffone, L P Ottolini, S Tonarini, G Gianelli, M D'Orazio and G Ó Fridleifsson    012026

-  Feasibility of X-ray analysis of multi-layer thin films at a single beam voltage

    P J Statham     012027

-  Monte Carlo simulation for an assessment of standard validity and quantitative X-ray microanalysis in plants

    G Tylko, S Dubchak, Z Banach and K Turnau    012028

-  Electron microprobe analysis (WDS EPMA) of Zhamanshin glass reveals the impactor and a common role of accretion in the origin of splash-form impact glass

    I Vetvicka, J Frank and J Drtina     012029